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author:

Liao, Yi (Liao, Yi.) [1] | Tang, Hu (Tang, Hu.) [2] | Luo, Zhi-Bang (Luo, Zhi-Bang.) [3] | Wang, Jian (Wang, Jian.) [4] | Wang, Wen-Qin (Wang, Wen-Qin.) [5]

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EI

Abstract:

The frequency diverse array (FDA) can generate a range-angle-coupled beampattern by introducing an additional frequency shift to its array element. The FDA has gained more and more attention due to its superiority over traditional phased array. However, different from phased arrays, frequency offset exists in the FDA as a unique parameter, its error will unavoidably affect the performance of the array, but current publications barely investigate into it. In this article, an approach based on interval analysis is proposed to analyze the tolerance of the power pattern, which is caused by the deviation of frequency offset in the manufacturing process. Numerical simulations are implemented to validate the proposed method and point out its characteristics and potential. © 1965-2011 IEEE.

Keyword:

Antenna phased arrays Error analysis Fits and tolerances Frequency allocation Monte Carlo methods Numerical methods

Community:

  • [ 1 ] [Liao, Yi]University of Electronic Science and Technology of China, School of Information and Communication Engineering, Chengdu; 611731, China
  • [ 2 ] [Tang, Hu]University of Electronic Science and Technology of China, School of Information and Communication Engineering, Chengdu; 611731, China
  • [ 3 ] [Luo, Zhi-Bang]University of Electronic Science and Technology of China, School of Information and Communication Engineering, Chengdu; 611731, China
  • [ 4 ] [Wang, Jian]Fuzhou University, College of Physics and Information Engineering, Fuzhou; 350108, China
  • [ 5 ] [Wang, Wen-Qin]University of Electronic Science and Technology of China, School of Information and Communication Engineering, Chengdu; 611731, China

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Source :

IEEE Transactions on Aerospace and Electronic Systems

ISSN: 0018-9251

Year: 2023

Issue: 3

Volume: 59

Page: 3424-3431

5 . 1

JCR@2023

5 . 1 0 0

JCR@2023

ESI HC Threshold:35

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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