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author:

Li, R. (Li, R..) [1] | Ye, D. (Ye, D..) [2] | Xu, J. (Xu, J..) [3] | Pan, J. (Pan, J..) [4]

Indexed by:

Scopus

Abstract:

To address the inverse problem of thermal growth oxide (TGO) thickness in thermal barrier coatings (TBCs), a novel multi-scale analysis (MSA) method based on terahertz time-domain spectroscopy (THz-TDS) is introduced. The proposed method involves a MSA technique based on four wavelet basis functions (db4, sym3, haar, coif3). Informative feature parameters characterizing the TGO thickness were extracted by performing continuous wavelet transform (CWT) and max-pooling operations on representative wavelet coefficients. Subsequently, multi-linear regression and machine learning regression models were employed to predict and assess the wavelet feature parameters. Experimental results revealed a discernible trend in the wavelet feature parameters obtained through CWT and max-pooling in the MSA, wherein the visual representation of TGO thickness initially increases and then gradually decreases. Significant variations in these feature parameters with changes in both thickness and scale enabled the effective inversion of TGO thickness. Building upon this, multi-linear regression and machine learning regression prediction were performed using multi-scale data based on four wavelet basis functions. Partial-scale data were selected for multi-linear regression, while full-scale data were selected for machine learning regression. Both methods demonstrated high accuracy prediction performance. In particular, the haar wavelet basis function exhibited excellent predictive performance, as evidenced by regression coefficients of 0.9763 and 0.9840, further confirming the validity of MSA. Hence, this study effectively presents a feasible method for the inversion problem of TGO thickness, and the analysis confirms the promising application potential of terahertz time-domain spectroscopy’s multi-scale analysis in the field of TBCs evaluation. These findings provide valuable insights for further reference. © 2023 by the authors.

Keyword:

multi-scale analysis terahertz time-domain spectroscopy thermal barrier coatings thermal growth oxide

Community:

  • [ 1 ] [Li R.]School of Mechanical Engineering, Anhui Polytechnic University, Wuhu, 241000, China
  • [ 2 ] [Li R.]Fujian Provincial Key Laboratory of Terahertz Functional Devices and Intelligent Sensing, Fuzhou University, Fuzhou, 350108, China
  • [ 3 ] [Li R.]School of Artificial Intelligence, Anhui Polytechnic University, Wuhu, 241000, China
  • [ 4 ] [Li R.]Huzhou Key Laboratory of Terahertz Integrated Circuits and Systems, Yangtze Delta Region Institute (Huzhou), University of Electronic Science and Technology of China, Huzhou, 313001, China
  • [ 5 ] [Li R.]Anhui Key Laboratory of Detection Technology and Energy Saving Devices, Anhui Polytechnic University, Wuhu, 241000, China
  • [ 6 ] [Ye D.]School of Mechanical Engineering, Anhui Polytechnic University, Wuhu, 241000, China
  • [ 7 ] [Ye D.]Fujian Provincial Key Laboratory of Terahertz Functional Devices and Intelligent Sensing, Fuzhou University, Fuzhou, 350108, China
  • [ 8 ] [Ye D.]School of Artificial Intelligence, Anhui Polytechnic University, Wuhu, 241000, China
  • [ 9 ] [Ye D.]Huzhou Key Laboratory of Terahertz Integrated Circuits and Systems, Yangtze Delta Region Institute (Huzhou), University of Electronic Science and Technology of China, Huzhou, 313001, China
  • [ 10 ] [Ye D.]Anhui Key Laboratory of Detection Technology and Energy Saving Devices, Anhui Polytechnic University, Wuhu, 241000, China
  • [ 11 ] [Xu J.]Department of Automotive Engineering and Intelligent Manufacturing, Wanjiang College of Anhui Normal University, Wuhu, 241008, China
  • [ 12 ] [Pan J.]School of Mechanical Engineering, Anhui Polytechnic University, Wuhu, 241000, China

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Source :

Coatings

ISSN: 2079-6412

Year: 2023

Issue: 7

Volume: 13

2 . 9

JCR@2023

2 . 9 0 0

JCR@2023

ESI HC Threshold:49

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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