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author:

Yu, Hongling (Yu, Hongling.) [1] | Zhou, Pan-Ke (Zhou, Pan-Ke.) [2] | Chen, Xiong (Chen, Xiong.) [3]

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EI

Abstract:

Covalent organic frameworks (COFs) are promising active mediums for high-performance data storage devices stemming from their high crystallinity, ordered porous channels, predetermined topology, and rigid architectures, while relative studies are still limited. Here, two COFs (i.e., COF-EtD and COF-EtA)-based resistive-switching memory devices are proposed to demonstrate the impact of intramolecular hydrogen bonding interactions, both of which exhibit nonvolatile write-once-read-many (WORM) memory characteristics. Comparatively, COF-EtD with the hydroxyl motif decoration illustrated a lower SET voltage (i.e., turn-on voltage) and a higher ON/OFF current ratio as well as exceptional high-temperature endurance and solvent resistance. Mechanism explorations suggest that the resistance-switching behavior of COF-EtD may be controlled by the synergistic effect of space-charge-limited current and conductive filaments. This finding is the first example of simply varying the functional group of COFs to regulate the WORM resistive switching behavior, providing some inspiration for the advancement of electronic memories and positively contributing to the realization of high endurance and high-density electric storage materials. © 2023 Wiley-VCH GmbH.

Keyword:

Crystallinity Hydrogen bonds Virtual storage

Community:

  • [ 1 ] [Yu, Hongling]State Key Laboratory of Photocatalysis on Energy and Environment, College of Chemistry, Fuzhou University, Fuzhou; 350108, China
  • [ 2 ] [Zhou, Pan-Ke]State Key Laboratory of Photocatalysis on Energy and Environment, College of Chemistry, Fuzhou University, Fuzhou; 350108, China
  • [ 3 ] [Chen, Xiong]State Key Laboratory of Photocatalysis on Energy and Environment, College of Chemistry, Fuzhou University, Fuzhou; 350108, China

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Source :

Advanced Functional Materials

ISSN: 1616-301X

Year: 2023

Issue: 44

Volume: 33

1 8 . 5

JCR@2023

1 8 . 5 0 0

JCR@2023

JCR Journal Grade:1

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 20

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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