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author:

Mi, J. (Mi, J..) [1] | Li, Q. (Li, Q..) [2] | Li, B. (Li, B..) [3] | Wang, W. (Wang, W..) [4] | Wang, S. (Wang, S..) [5] | Zheng, F. (Zheng, F..) [6] | Guo, G. (Guo, G..) [7]

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Scopus

Abstract:

Metal-organic frameworks (MOFs) have recently gained extensive attention as potential materials for direct radiation detection due to their strong radiation absorption, long-range order, and chemical tunability. However, it remains challenging to develop a practical MOF-based X-ray direct detector that possesses high X-ray detection efficiency, radiation stability, and environmental friendliness. The integration of donor-acceptor (D-A) pairs into crystalline MOFs is a powerful strategy for the precise fabrication of multifunctional materials with unique optoelectronic properties. Herein, a new lead-free MOF, Cu2I2(TPPA) (CuI-TPPA, TPPA = tris[4-(pyridine-4-yl)phenyl]amine), with a 6-fold interpenetrated structure is designed and synthesized based on the electron donor-acceptor strategy. CuI-TPPA has a large mobility-lifetime (μτ) product of 5.8 × 10-4 cm2 V-1 and a high detection sensitivity of 73.1 μC Gyair-1 cm-2, surpassing that of commercial α-Se detectors. Moreover, the detector remains fairly stable with only a 2% reduction in photocurrent under continuous bias irradiation conditions with a total dose of over 42.83 Gyair. The CuI-TPPA/poly(vinylidene fluoride) flexible composite X-ray detector films are successfully manufactured with different thicknesses. Through multifaceted assessments, the optimal thickness is found with a high detection sensitivity of up to 143.6 μC Gyair-1 cm-2. As proof-of-concept, 11 × 9 pixelated X-ray detectors are fabricated on the same composite film to realize X-ray direct imaging. This work opens up potential applications of MOFs in environmentally friendly and wearable devices for direct X-ray detection and imaging. © 2024 American Chemical Society.

Keyword:

electron donor−acceptor lead-free metal−organic frameworks semiconductor X-ray direct detection and imaging

Community:

  • [ 1 ] [Mi J.]College of Chemistry, Fuzhou University, Fujian, Fuzhou, 350108, China
  • [ 2 ] [Mi J.]State Key Laboratory of Structural Chemistry, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fujian, Fuzhou, 350002, China
  • [ 3 ] [Li Q.]College of Chemistry, Fuzhou University, Fujian, Fuzhou, 350108, China
  • [ 4 ] [Li Q.]State Key Laboratory of Structural Chemistry, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fujian, Fuzhou, 350002, China
  • [ 5 ] [Li B.]State Key Laboratory of Structural Chemistry, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fujian, Fuzhou, 350002, China
  • [ 6 ] [Wang W.]State Key Laboratory of Structural Chemistry, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fujian, Fuzhou, 350002, China
  • [ 7 ] [Wang S.]State Key Laboratory of Structural Chemistry, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fujian, Fuzhou, 350002, China
  • [ 8 ] [Wang S.]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fujian, Fuzhou, 350108, China
  • [ 9 ] [Zheng F.]State Key Laboratory of Structural Chemistry, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fujian, Fuzhou, 350002, China
  • [ 10 ] [Zheng F.]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fujian, Fuzhou, 350108, China
  • [ 11 ] [Zheng F.]Fujian College, University of Chinese Academy of Sciences, Fujian, Fuzhou, 350002, China
  • [ 12 ] [Guo G.]State Key Laboratory of Structural Chemistry, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fujian, Fuzhou, 350002, China
  • [ 13 ] [Guo G.]Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fujian, Fuzhou, 350108, China
  • [ 14 ] [Guo G.]Fujian College, University of Chinese Academy of Sciences, Fujian, Fuzhou, 350002, China

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Source :

ACS Applied Materials and Interfaces

ISSN: 1944-8244

Year: 2024

Issue: 7

Volume: 16

Page: 9002-9011

8 . 5 0 0

JCR@2023

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 5

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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