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author:

Bai, H. (Bai, H..) [1] | Chen, M.-Y. (Chen, M.-Y..) [2] | Guo, M.-F. (Guo, M.-F..) [3] | Liu, Y.-P. (Liu, Y.-P..) [4] | Gao, J.-H. (Gao, J.-H..) [5]

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Scopus

Abstract:

The existing single-phase grounding (SPG) fault section location methods typically suffer from difficulty in feature selection, limited feeder terminal units (FTUs) configuration, and excessive dependence on communication, which weaken their generalization and robustness. To overcome these challenges, an SPG fault section location approach based on feature subset optimization is proposed. First, the relation between the position of FTU and its three-phase current variation is analyzed, and its fault features are extracted to construct the candidate feature sets as feature subset optimization objects. Then, genetic algorithm and support vector machine (SVM) are combined to select the optimal feature subset with small dimensions and recognition error, which avoids the empirical errors of artificial feature selection. To reduce the cumulative errors, the SVM hyperparameters are simultaneously optimized. Finally, the SVM model is trained based on the optimal feature subset and hyperparameters. In the absence of zero-sequence current measurement, three-phase currents measured by FTU are locally processed to locate the fault section by the trained SVM. The experimental results verified the effectiveness and feasibility of the proposed method. © 2024 John Wiley & Sons Ltd.

Keyword:

distribution networks fault section location feature subset optimization genetic algorithm (GA) single-phase grounding fault support vector machine (SVM)

Community:

  • [ 1 ] [Bai H.]Electric Power Research Institute, China Southern Power Grid, Guangzhou, China
  • [ 2 ] [Chen M.-Y.]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China
  • [ 3 ] [Guo M.-F.]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China
  • [ 4 ] [Liu Y.-P.]Electric Power Research Institute, China Southern Power Grid, Guangzhou, China
  • [ 5 ] [Gao J.-H.]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China

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Source :

International Journal of Circuit Theory and Applications

ISSN: 0098-9886

Year: 2024

Issue: 9

Volume: 52

Page: 4582-4599

1 . 8 0 0

JCR@2023

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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