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author:

Zhuang, Hongbin (Zhuang, Hongbin.) [1] | Li, Xiao-Yan (Li, Xiao-Yan.) [2] (Scholars:李小燕) | Chang, Jou-Ming (Chang, Jou-Ming.) [3] | Liu, Ximeng (Liu, Ximeng.) [4] (Scholars:刘西蒙)

Indexed by:

EI Scopus SCIE

Abstract:

The kary n-cube Q(n)(k) serves as an indispensable interconnection network in the design of data center networks, network-on-chips, and parallel computing systems since it possesses numerous attractive properties. In these parallel architectures, the paired (or unpaired) many-to-many m-disjoint path cover (m-DPC) plays a significant role in message transmission. Nevertheless, the construction of m-DPC is severely obstructed by large-scale edge faults due to the rapid growth of the system scale. In this paper, we investigate the existence of paired 2-DPC in Q(n)(k) under the partitioned edge fault (PEF) model, which is a novel fault model for enhancing the networks' fault-tolerance related to path embedding problem. We exploit this model to evaluate the edge fault-tolerance of Q(n)(k) when a paired 2-DPC is embedded into Q(n)(k). Compared to the other known works, our results can help Q(n)(k) to achieve large-scale edge fault-tolerance.

Keyword:

Fault-tolerant embedding Interconnection networks k-ary n-cubes Paired 2-disjoint path cover PEF model

Community:

  • [ 1 ] [Zhuang, Hongbin]Fuzhou Univ, Coll Comp & Data Sci, Fuzhou 350108, Peoples R China
  • [ 2 ] [Li, Xiao-Yan]Fuzhou Univ, Coll Comp & Data Sci, Fuzhou 350108, Peoples R China
  • [ 3 ] [Liu, Ximeng]Fuzhou Univ, Coll Comp & Data Sci, Fuzhou 350108, Peoples R China
  • [ 4 ] [Chang, Jou-Ming]Natl Taipei Univ Business, Inst Informat & Decis Sci, Taipei 10051, Taiwan

Reprint 's Address:

  • 李小燕

    [Li, Xiao-Yan]Fuzhou Univ, Coll Comp & Data Sci, Fuzhou 350108, Peoples R China

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Source :

JOURNAL OF PARALLEL AND DISTRIBUTED COMPUTING

ISSN: 0743-7315

Year: 2024

Volume: 190

3 . 4 0 0

JCR@2023

Cited Count:

WoS CC Cited Count: 1

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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