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author:

Wang, D. (Wang, D..) [1] | Zhuang, J. (Zhuang, J..) [2] | Hou, W. (Hou, W..) [3] | Yan, X. (Yan, X..) [4] | Hu, H. (Hu, H..) [5] | Guo, T. (Guo, T..) [6] | Li, F. (Li, F..) [7]

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Abstract:

Quantum dot light-emitting diodes (QLEDs), as an emerging display technology, have garnered widespread attention due to their excellent color rendering, high efficiency, and long lifespan. However, the inherent differences in the properties of charge transport layer materials inevitably lead to charge injection imbalances and low device performance. Herein, we developed a simple technique by using femtosecond laser scanning over the QLED devices. The results indicate that scanning with a femtosecond laser improves the conductivity of the hole transport layer and increases the external quantum efficiency of the QLED devices. Our work provides an effective route for realizing high performance QLED devices with efficient post-treatment. © 2024 Author(s).

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  • [ 1 ] [Wang D.]Institute of Optoelectronic Technology, Fuzhou University, Fuzhou, 350108, China
  • [ 2 ] [Zhuang J.]National Center of Technology Innovation for Display, Guangzhou, 510525, China
  • [ 3 ] [Hou W.]TCL Research, Shenzhen, 518057, China
  • [ 4 ] [Yan X.]TCL Research, Shenzhen, 518057, China
  • [ 5 ] [Hu H.]Institute of Optoelectronic Technology, Fuzhou University, Fuzhou, 350108, China
  • [ 6 ] [Guo T.]Institute of Optoelectronic Technology, Fuzhou University, Fuzhou, 350108, China
  • [ 7 ] [Li F.]Institute of Optoelectronic Technology, Fuzhou University, Fuzhou, 350108, China

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AIP Advances

ISSN: 2158-3226

Year: 2024

Issue: 4

Volume: 14

1 . 4 0 0

JCR@2023

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ESI Highly Cited Papers on the List: 0 Unfold All

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Chinese Cited Count:

30 Days PV: 1

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