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author:

Jiang, R. (Jiang, R..) [1] | Zheng, Y. (Zheng, Y..) [2] | Chen, D. (Chen, D..) [3] | Zhang, H. (Zhang, H..) [4]

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Scopus

Abstract:

Traditional polarimetric current-sensing methods contain many optical devices, leading to poor reliability. Also, their sensing output is distorted by massive system noise. To address these issues, this paper presents a polarimetric current-sensing method using single-axis polarization encoding (SPE) and a dynamically decoding algorithm. A single-axis circulator and a Faraday rotator mirror are used to encode the measured current by light. The SPE only requires these two optical devices in the light-propagation path, enhancing the measurement reliability. The encoding process can significantly suppress the noise by eliminating high-order terms. To correctly restore the current signals, the light intensity is decoded by Jones-matrix analysis and dynamic parameters. Finally, normal currents, fault currents and harmonic currents in grids are used to test the performance of the presented method. The results show that the maximum amplitude error is smaller than 1.3% in a wide range of amplitudes, frequencies, temperatures and vibrations, and the signal-to-noise ratio and number of devices required in the path are 51.43 dB and 2, respectively (those of the recently published polarimetric method are 1.7%, -4.24 dB and 5, respectively). IEEE

Keyword:

Current measurement Decoding Distortion measurement dynamically decoding Noise Optical variables measurement polarimetric reliability Sagnac interferometers single-axis polarization encoding Temperature measurement

Community:

  • [ 1 ] [Jiang R.]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China
  • [ 2 ] [Zheng Y.]College of Electrical Engineering and Automation, Fuzhou University, Fuzhou, China
  • [ 3 ] [Chen D.]Department of Electrical Engineering, Yuan Ze University, Taoyuan, Taiwan
  • [ 4 ] [Zhang H.]College of Electronic Information Science, Fujian Jiangxia University, Fuzhou, China

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Source :

IEEE Transactions on Instrumentation and Measurement

ISSN: 0018-9456

Year: 2024

Volume: 73

Page: 1-1

5 . 6 0 0

JCR@2023

Cited Count:

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ESI Highly Cited Papers on the List: 0 Unfold All

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Chinese Cited Count:

30 Days PV: 0

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