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author:

Wu, Yilin (Wu, Yilin.) [1] | Guo, Wenzhong (Guo, Wenzhong.) [2] (Scholars:郭文忠) | Lin, Yaojin (Lin, Yaojin.) [3]

Indexed by:

EI Scopus SCIE

Abstract:

In label distribution learning (LDL), an instance is involved with many labels in different importance degrees, and the feature space of instances is accompanied with thousands of redundant and/or irrelevant features. Therefore, the main characteristic of feature selection in LDL is to evaluate the ability of each feature. Motivated by neighborhood rough set (NRS), which can be used to measure the dependency degree of feature via constructing neighborhood relations on feature space and label space, respectively, this article proposes a novel label distribution feature selection method. In this article, the neighborhood class of instance in label distribution space is defined, which is beneficial to recognize the logical class of target instance. Then, a new NRS model for LDL is proposed. Specially, the dependency degree of feature combining label weight is defined. Finally, a label distribution feature selection based on NRS is presented. Extensive experiments on 12 data sets show the effectiveness of the proposed algorithm.

Keyword:

feature selection label ambiguity label distribution learning neighborhood rough set

Community:

  • [ 1 ] [Wu, Yilin]Fuzhou Univ, Coll Comp & Data Sci, Fuzhou, Peoples R China
  • [ 2 ] [Guo, Wenzhong]Fuzhou Univ, Coll Comp & Data Sci, Fuzhou, Peoples R China
  • [ 3 ] [Wu, Yilin]Fuzhou Univ, Key Lab Network Comp & Intelligent Informat Proc, Fuzhou, Peoples R China
  • [ 4 ] [Guo, Wenzhong]Fuzhou Univ, Key Lab Network Comp & Intelligent Informat Proc, Fuzhou, Peoples R China
  • [ 5 ] [Lin, Yaojin]Minnan Normal Univ, Sch Comp Sci, Zhangzhou, Peoples R China

Reprint 's Address:

  • [Wu, Yilin]Fuzhou Univ, Coll Comp & Data Sci, Fuzhou, Peoples R China;;

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Source :

CONCURRENCY AND COMPUTATION-PRACTICE & EXPERIENCE

ISSN: 1532-0626

Year: 2024

Issue: 23

Volume: 36

1 . 5 0 0

JCR@2023

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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