In　recent　years,　metal　halide　perovskites　have　garnered　significant　attention　in　the　field　of　X-ray　detection　due　to　their　outstanding　photoelectric　properties,　high　X-ray　attenuation　coefficients,　and　the　advantage　of　being　able　to　be　fabricated　by　low-cost　solution　processing　methods.　However,　a　major　challenge　in　developing　perovskite　X-ray　detectors　lies　in　the　low　quality　of　films　produced　through　solution　processing.　In　this　work,　we　introduce　an　efficient　method　that　employs　a　straightforward　blade-coating　technique　to　successfully　prepare　MAPbI3　perovskite　films　with　a　thickness　of　tens　of　microns　under　ambient　conditions.　To　further　improve　the　quality　of　the　MAPbI3　films,　we　incorporate　the　polymer　polyvinylpyrrolidone　(PVP)　into　the　perovskite　precursor　solution.　The　addition　of　PVP　promotes　crystal　growth,　resulting　in　an　enlarged　grain　size　and　a　more　uniform　arrangement　within　the　perovskite　film.　This　enhancement　leads　to　a　reduction　in　defect　density　and　subsequent　improvement　in　the　charge　collection　efficiency.　Consequently,　the　detector　manufactured　using　the　PVP-optimized　film　exhibits　an　enhanced　X-ray　sensitivity　of　2.6　x　103　mu　C　Gyair-1　cm-2　and　achieves　a　low　detection　limit　of　11　nGyair　s-1　under　10　keV　X-ray　energy,　surpassing　those　achieved　with　the　original　perovskite　film　which　measured　0.60　x　103　mu　C　Gyair-1　cm-2　and　139　nGyair　s-1　under　the　same　conditions.　This　work　unlocks　new　prospects　for　the　straightforward　and　cost-effective　manufacture　of　high-performance　X-ray　detectors.