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author:

Wang, Wenyong (Wang, Wenyong.) [1] | Cai, Yuanzheng (Cai, Yuanzheng.) [2] | Wang, Tao (Wang, Tao.) [3]

Indexed by:

EI

Abstract:

To mitigate the impact of noisy labels, many methods prioritize simple samples with reliable labels, often overlooking the valuable information in more challenging samples. This study introduces SRODET, a novel semi-supervised remote sensing object detection model that leverages sample complexity to extract accurate pseudo-labeled knowledge. We employ a dual-branch structure (DBS) to generate reliable pseudo labels for auxiliary supervision, enhancing joint supervision to derive high-quality pseudo labels from low-confidence predictions. This approach reduces the risk of losing object instances due to low-confidence scores, particularly for extreme scales. Additionally, we introduce a pseudo-label training strategy based on sample difficulty, evaluating complexity through object uncertainty and angular information from remote sensing images. Our experimental results show that SRODET achieves state-of-the-art performance in semi-supervised remote sensing object detection across various settings in the DOTA-v1.5 and HRSC2016 benchmarks. © 2004-2012 IEEE.

Keyword:

Image enhancement Object detection Object recognition Optical remote sensing

Community:

  • [ 1 ] [Wang, Wenyong]Fuzhou University, College of Computer and Data Science, Fuzhou; 350108, China
  • [ 2 ] [Cai, Yuanzheng]Minjiang University, Fujian Provincial Key Laboratory of Information Processing and Intelligent Control, School of Computer and Data Science, Fuzhou; 350121, China
  • [ 3 ] [Wang, Tao]Minjiang University, Fujian Provincial Key Laboratory of Information Processing and Intelligent Control, School of Computer and Data Science, Fuzhou; 350121, China

Reprint 's Address:

  • [cai, yuanzheng]minjiang university, fujian provincial key laboratory of information processing and intelligent control, school of computer and data science, fuzhou; 350121, china

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Source :

IEEE Geoscience and Remote Sensing Letters

ISSN: 1545-598X

Year: 2025

Volume: 22

4 . 0 0 0

JCR@2023

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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