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author:

Zhang, Qiukun (Zhang, Qiukun.) [1] (Scholars:张秋坤) | Zhong, Shuncong (Zhong, Shuncong.) [2] (Scholars:钟舜聪) | Lin, Jiewen (Lin, Jiewen.) [3] | Huang, Yuexin (Huang, Yuexin.) [4] | Nsengiyumva, Walter (Nsengiyumva, Walter.) [5] | Chen, Weiqiang (Chen, Weiqiang.) [6] | Luo, Manting (Luo, Manting.) [7] | Zhong, Jiangfeng (Zhong, Jiangfeng.) [8] (Scholars:钟剑锋) | Yu, Yingjie (Yu, Yingjie.) [9] | Peng, Zhike (Peng, Zhike.) [10] | Cheng, Shuying (Cheng, Shuying.) [11] (Scholars:程树英)

Indexed by:

EI Scopus SCIE

Abstract:

The Optical Coherence Velocimeter (OCV) technology is a technique for high-precision displacement and vibration measurement based on the principle of spectral domain optical coherence method. The key of this technology is to realize nanometer or even sub-nanometer measurement by high precision frequency estimation method called as Hanning-window energy centrobaric method (HnWECM). This paper analyses the error transmission process of HnWECM, and proposes a calculation method based on Paserval's theorem to establishes the accuracy theory of HnWECM. It shows that the variance of the estimated frequency using HnWECM is only proportional to the signal-to-noise ratio (SNR) and very close to the Cramer-Rao Lower Bound (CRLB). The estimation performance of HnWECM is verified and compared with other frequency estimation methods by simulation and experimental results. Both the theoretical analysis and simulation results show that the HnWECM has good statistical efficiency and the best anti-noise stability. This paper reveals the reason of chosen HnWECM as the signal processing method of OCV technology and gives its accuracy theory, which will greatly promote the application of OCV technology.

Keyword:

Anti-noise analysis Frequency estimation Optical coherence velocimeter Optical interferometric sensors

Community:

  • [ 1 ] [Zhang, Qiukun]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350116, Peoples R China
  • [ 2 ] [Zhong, Shuncong]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350116, Peoples R China
  • [ 3 ] [Lin, Jiewen]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350116, Peoples R China
  • [ 4 ] [Huang, Yuexin]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350116, Peoples R China
  • [ 5 ] [Nsengiyumva, Walter]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350116, Peoples R China
  • [ 6 ] [Chen, Weiqiang]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350116, Peoples R China
  • [ 7 ] [Luo, Manting]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350116, Peoples R China
  • [ 8 ] [Zhong, Jiangfeng]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350116, Peoples R China
  • [ 9 ] [Zhang, Qiukun]Fuzhou Univ, Sch Phys & Informat Engn, Fuzhou 350116, Peoples R China
  • [ 10 ] [Cheng, Shuying]Fuzhou Univ, Sch Phys & Informat Engn, Fuzhou 350116, Peoples R China
  • [ 11 ] [Zhong, Shuncong]Shanghai Univ, Sch Mechatron Engn & Automat, Dept Precis Mech Engn, Shanghai 200072, Peoples R China
  • [ 12 ] [Yu, Yingjie]Shanghai Univ, Sch Mechatron Engn & Automat, Dept Precis Mech Engn, Shanghai 200072, Peoples R China
  • [ 13 ] [Luo, Manting]Putian Univ, Modern Precis Measurement & Laser Nondestruct Tes, Putian 351100, Peoples R China
  • [ 14 ] [Peng, Zhike]Shanghai Jiao Tong Univ, Sch Mech Engn, State Key Lab Mech Syst & Vibrat, Shanghai 200240, Peoples R China

Reprint 's Address:

  • 钟舜聪

    [Zhong, Shuncong]Fuzhou Univ, Sch Mech Engn & Automat, Lab Opt Terahertz & Nondestruct Testing, Fuzhou 350116, Peoples R China;;[Zhong, Shuncong]Shanghai Univ, Sch Mechatron Engn & Automat, Dept Precis Mech Engn, Shanghai 200072, Peoples R China

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Source :

OPTICS AND LASERS IN ENGINEERING

ISSN: 0143-8166

Year: 2020

Volume: 134

4 . 8 3 6

JCR@2020

3 . 5 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:132

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 15

SCOPUS Cited Count: 16

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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