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author:

Lai, Huan Sheng (Lai, Huan Sheng.) [1] | Fan, Deng Shuai (Fan, Deng Shuai.) [2] | Bai, Chunmei (Bai, Chunmei.) [3] | Liu, Kang Lin (Liu, Kang Lin.) [4] (Scholars:刘康林)

Indexed by:

EI Scopus SCIE

Abstract:

It is crucial to exactly predict the value of C* in order to predict creep crack growth and assess the creep life of high temperature structures. The coefficient of h(1), in the modified General Electric/Electric Power Research Institute (GE/EPRI) method for power-law creep materials with a threshold stress, was determined in this paper using the finite element method for various crack ratios and creep exponents of n. The effects that both the threshold stress and the load level have on the values of h(1) were also investigated. The results of the study indicated that the values of h(1) were obviously affected by the threshold stress at a low level of C*, but that they remained almost constant with the increased threshold stress at high levels of C*. The discrepancy of the value of h(1) between the two levels of C* increased as the threshold stress increased.

Keyword:

estimation of C* h(1) threshold stress

Community:

  • [ 1 ] [Lai, Huan Sheng]Sun Yat Sen Univ, Sino French Inst Nucl Engn & Technol, Zhuhai 519082, Peoples R China
  • [ 2 ] [Lai, Huan Sheng]Fuzhou Univ, Sch Chem Engn, Fuzhou 350116, Fujian, Peoples R China
  • [ 3 ] [Fan, Deng Shuai]Fuzhou Univ, Sch Chem Engn, Fuzhou 350116, Fujian, Peoples R China
  • [ 4 ] [Liu, Kang Lin]Fuzhou Univ, Sch Chem Engn, Fuzhou 350116, Fujian, Peoples R China
  • [ 5 ] [Bai, Chunmei]Sun Yat Sen Univ, Sch Civil Engn, Zhuhai 519082, Peoples R China

Reprint 's Address:

  • [Bai, Chunmei]Sun Yat Sen Univ, Sch Civil Engn, Zhuhai 519082, Peoples R China

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Source :

MATERIALS AT HIGH TEMPERATURES

ISSN: 0960-3409

Year: 2019

Issue: 4

Volume: 36

Page: 335-343

1 . 3 8 9

JCR@2019

1 . 0 0 0

JCR@2023

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:236

JCR Journal Grade:4

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count: 1

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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