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author:

Chen, Y. P. (Chen, Y. P..) [1] | Zheng, C. H. (Zheng, C. H..) [2] | Hu, L. Q. (Hu, L. Q..) [3] | Chen, Y. R. (Chen, Y. R..) [4]

Indexed by:

Scopus SCIE

Abstract:

It is a critical challenge to realize efficient GaN-based UV photodetectors (UV-PDs) due to the existence of high-density dislocations in the epilayers prepared by heteroepitaxy. In this paper, the method of in-situ modifying the screw dislocations in GaN-based materials with one-dimensional (1D) ZnO nanorods by screw dislocation-driven self-assembled solution growth is developed to engineer and improve the photoelectric performances of the back-illuminated metal-semiconductor-metal (MSM) structure p-GaN UV-PDs. The results show that the in-situ grown 1D ZnO nanorods on the dislocations plays the roles of passivating the dislocations to suppress the dark current, improving the spectral response intensity and extending the spectral response band of the MSM structure UV-PDs. The in-situ modification of 1D ZnO nanomaterials can be developed into a method to engineer and modify the defects viz. threading dislocations of the GaN-based semiconductors so as to achieve the purpose of regulating the performance of the related optoelectronic devices, which can be extended to other material systems of optoelectronic devices. (C) 2018 Elsevier B.V. All rights reserved.

Keyword:

GaN-based ultroviolet photodetectors Metal-semiconductor-metal Photoelectric performance improvement Screw dislocation passivation ZnO nanorods modification

Community:

  • [ 1 ] [Chen, Y. P.]Quanzhou Normal Univ, Coll Resource & Environm, Quanzhou 362000, Peoples R China
  • [ 2 ] [Zheng, C. H.]Quanzhou Normal Univ, Coll Resource & Environm, Quanzhou 362000, Peoples R China
  • [ 3 ] [Hu, L. Q.]Fuzhou Univ, Inst Optoelect Technol, Fuzhou 350002, Fujian, Peoples R China
  • [ 4 ] [Chen, Y. R.]Chinese Acad Sci, Changchun Inst Opt Fine Mech & Phys, State Key Lab Luminescence & Applicat, Changchun 130033, Jilin, Peoples R China

Reprint 's Address:

  • [Zheng, C. H.]Quanzhou Normal Univ, Coll Resource & Environm, Quanzhou 362000, Peoples R China;;[Chen, Y. R.]Chinese Acad Sci, Changchun Inst Opt Fine Mech & Phys, State Key Lab Luminescence & Applicat, Changchun 130033, Jilin, Peoples R China

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Source :

JOURNAL OF ALLOYS AND COMPOUNDS

ISSN: 0925-8388

Year: 2019

Volume: 775

Page: 1213-1220

4 . 6 5

JCR@2019

5 . 8 0 0

JCR@2023

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:236

JCR Journal Grade:2

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 7

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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