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author:

Huang, Yifan (Huang, Yifan.) [1] (Scholars:黄奕钒) | Xu, Qifeng (Xu, Qifeng.) [2] | Chen, Kun-Long (Chen, Kun-Long.) [3] | Zhou, Jie (Zhou, Jie.) [4]

Indexed by:

EI Scopus SCIE

Abstract:

This paper investigates the possibilities of optimizing the Pockels electric field in a transverse modulated optical voltage sensor with a spherical electrode structure. The simulations show that due to the edge effect and the electric field concentrations and distortions, the electric field distributions in the crystal are non-uniform. In this case, a tiny variation in the light path leads to an integral error of more than 0.5%. Moreover, a 2D model cannot effectively represent the edge effect, so a 3D model is employed to optimize the electric field distributions. Furthermore, a new method to attach a quartz crystal to the electro-optic crystal along the electric field direction is proposed to improve the non-uniformity of the electric field. The integral error is reduced therefore from 0.5% to 0.015% and less. The proposed method is simple, practical and effective, and it has been validated by numerical simulations and experimental tests.

Keyword:

edge effect electric field concentrations and distortions electric-field distribution light path variation measurement error optical voltage sensor

Community:

  • [ 1 ] [Huang, Yifan]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350116, Fujian, Peoples R China
  • [ 2 ] [Xu, Qifeng]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350116, Fujian, Peoples R China
  • [ 3 ] [Chen, Kun-Long]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350116, Fujian, Peoples R China
  • [ 4 ] [Zhou, Jie]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350116, Fujian, Peoples R China

Reprint 's Address:

  • 徐启峰

    [Xu, Qifeng]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350116, Fujian, Peoples R China

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Source :

MEASUREMENT SCIENCE AND TECHNOLOGY

ISSN: 0957-0233

Year: 2018

Issue: 5

Volume: 29

1 . 8 6 1

JCR@2018

2 . 7 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:170

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 4

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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