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author:

Liu, Wenli (Liu, Wenli.) [1] (Scholars:刘文丽) | Wang, Ying-Ming (Wang, Ying-Ming.) [2] (Scholars:王应明) | Lyu, Shulong (Lyu, Shulong.) [3] (Scholars:吕书龙)

Indexed by:

SSCI EI Scopus SCIE

Abstract:

Data envelopment analysis (DEA) has been extended to handle random inputs and outputs by using chance constrained programming. In this paper, for DMUs with random inputs and outputs, we aim to measure a kind of relative efficiency, and achieve it from the optimistic viewpoint and the pessimistic viewpoint respectively. Considering the quantile of the distribution of the weighted output-input ratio of each DMU, we develop two stochastic DEA models to obtain the upper and lower bounds of the quantile efficiency under a constraint, and then achieve an interval efficiency evaluation. The best quantile efficiency and the worst quantile efficiency achieved by our models are closely similar to the CCR efficiency and belong to relative efficiencies. Further, the deterministic equivalents of our models are developed when the input and output vector of each DMU follows a multivariate joint normal distribution. Finally, three examples are presented to illustrate the performance of our approach. (C) 2017 Elsevier Ltd. All rights reserved.

Keyword:

Chance constraint Data envelopment analysis Interval efficiency Quantile Stochastic DEA

Community:

  • [ 1 ] [Liu, Wenli]Fuzhou Univ, Decis Sci Inst, Sch Econ & Management, 2 Xueyuan Rd, Fuzhou 350116, Peoples R China
  • [ 2 ] [Wang, Ying-Ming]Fuzhou Univ, Decis Sci Inst, Sch Econ & Management, 2 Xueyuan Rd, Fuzhou 350116, Peoples R China
  • [ 3 ] [Liu, Wenli]Fuzhou Univ, Sch Math & Comp Sci, 2 Xueyuan Rd, Fuzhou 350116, Peoples R China
  • [ 4 ] [Lyu, Shulong]Fuzhou Univ, Sch Math & Comp Sci, 2 Xueyuan Rd, Fuzhou 350116, Peoples R China

Reprint 's Address:

  • 王应明

    [Wang, Ying-Ming]Fuzhou Univ, Decis Sci Inst, Sch Econ & Management, 2 Xueyuan Rd, Fuzhou 350116, Peoples R China

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Source :

EXPERT SYSTEMS WITH APPLICATIONS

ISSN: 0957-4174

Year: 2017

Volume: 85

Page: 14-24

3 . 7 6 8

JCR@2017

7 . 5 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:177

JCR Journal Grade:1

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 11

SCOPUS Cited Count: 16

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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