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author:

Lai, Huan Sheng (Lai, Huan Sheng.) [1] | Ryu, Sung Woo (Ryu, Sung Woo.) [2] | Yoon, Kee Bong (Yoon, Kee Bong.) [3] | Lin, Xin Peng (Lin, Xin Peng.) [4]

Indexed by:

EI Scopus SCIE

Abstract:

C-t is an important parameter in predicting creep crack growth life from the small-scale creep stage to the extensive steady state creep stage. In this paper, weld interface and non-interface creep cracks for compact tension (CT) specimens with heat-affected zone (HAZ) were studied by finite element method (FEM) to systematically research the estimation method of C-t for weld creep cracks. Simulation results showed that C-t of weld interface cracks could be estimated by Yoon's method. For weld non-interface cracks, C-t under the small-scale and transition creep stages could be exactly estimated by a proposed method. The accuracy of the proposed method was not affected by HAZ, but Yoon's method was slightly affected by HAZ.

Keyword:

C-t estimation Interface crack Non-interface crack Weld crack

Community:

  • [ 1 ] [Lai, Huan Sheng]Chung Ang Univ, Dept Mech Engn, 221 Huksuk Dongjak, Seoul 156756, South Korea
  • [ 2 ] [Ryu, Sung Woo]Chung Ang Univ, Dept Mech Engn, 221 Huksuk Dongjak, Seoul 156756, South Korea
  • [ 3 ] [Yoon, Kee Bong]Chung Ang Univ, Dept Mech Engn, 221 Huksuk Dongjak, Seoul 156756, South Korea
  • [ 4 ] [Lai, Huan Sheng]Fuzhou Univ, Sch Chem Engn, Fuzhou 350116, Fujian, Peoples R China
  • [ 5 ] [Lin, Xin Peng]Ningde Nucl Power Co Ltd, Syst Equipment Div, 226 Riverside Rd, Fuding 355200, Fujian, Peoples R China

Reprint 's Address:

  • 赖焕生

    [Lai, Huan Sheng]Chung Ang Univ, Dept Mech Engn, 221 Huksuk Dongjak, Seoul 156756, South Korea;;[Lai, Huan Sheng]Fuzhou Univ, Sch Chem Engn, Fuzhou 350116, Fujian, Peoples R China

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Source :

MATERIALS AT HIGH TEMPERATURES

ISSN: 0960-3409

Year: 2016

Issue: 6

Volume: 33

Page: 596-603

0 . 8 0 2

JCR@2016

1 . 0 0 0

JCR@2023

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:324

JCR Journal Grade:3

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 4

SCOPUS Cited Count: 4

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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