Electrodes　consisting　of　coating　of　the　Iridium　oxide-Zirconium　oxide　(70%　IrO2-30%　ZrO2)　binary　oxide　were　formed　on　Ti　substrates　by　thermal　decomposition　and　annealing　at　340　degrees　C-450　degrees　C.　The　effects　of　the　annealing　temperature　on　the　structure,　surface　morphology,　surface　composition,　and　capacitive　performance　of　the　coatings　were　investigated　using　X-ray　diffraction　analysis　(XRD),　transmission　electron　microscopy　(TEM),　scanning　electron　microscopy,　X-ray　photoelectron　spectroscopy,　cyclic　voltammetry,　and　electrochemical　impedance　spectroscopy　(EIS).　The　XRD　and　TEM　analyses　showed　that　360　degrees　C　is　greater　than　but　very　close　to　the　crystallization　temperature　of　the　70%　IrO2-30%　ZrO2　oxide　coating.　The　70%　IrO2-30%　ZrO2　oxide　coatings　annealed　at　this　temperature　consisted　of　an　amorphous　matrix　containing　a　few　IrO2　nanocrystalline　particles　(diameter　of　1-2　nm).　The　degree　of　crystallinity　of　the　coatings　was　approximately　13.2%.　EIS　analysis　showed　that　the　electrode　annealed　at　360　degrees　C　exhibited　the　highest　specific　capacitance,　which　was　much　higher　than　that　of　the　electrode　annealed　at　340　degrees　C　(which　had　a　purely　amorphous　structure)　as　well　as　those　of　the　electrodes　annealed　at　380　degrees　C　and　400　degrees　C　(which　had　higher　degrees　of　crystallinity).　On　the　basis　of　the　obtained　results,　the　following　conclusion　can　be　drawn:　oxide　coatings　prepared　at　temperatures　slightly　higher　than　the　crystallization　temperature　of　the　oxide　and　containing　conductive　nanocrystalline　particles　exhibit　the　best　capacitive　performance.　We　suggest　that　this　phenomenon　can　be　explained　by　the　fact　that　the　electronic　conductivity　of　the　coating　is　greatly　improved　by　the　presence　of　the　homogeneously　distributed　conductive　nanocrystalline　particles　in　the　amorphous　matrix.　Furthermore,　the　protonic　conductivity　and　loose　atomic　configuration　of　the　amorphous　structure　of　the　electrode　are　not　adversely　affected　by　the　annealing　treatment.