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author:

Li, Shuguang (Li, Shuguang.) [1] | Lam, Kin-Tak (Lam, Kin-Tak.) [2] | Huang, Wei-Chih (Huang, Wei-Chih.) [3] | Chang, Shoou-Jinn (Chang, Shoou-Jinn.) [4]

Indexed by:

EI Scopus SCIE

Abstract:

The authors propose the use of SU-8 to passivate the isolation trenches of GaN-based high-voltage light-emitting diodes (HV-LEDs). Compared with the HV-LED chips prepared with pure SU-8 passivation, it was found that we could increase the production yield from <= 35% to >= 88% using properly diluted SU-8 passivation layer. It was also found that we could reduce the passivation layer thickness by diluting SU-8 with a ratio of 5:2. Furthermore, it was found that the properly diluted SU-8 could provide smooth surface, minimized crack formation, and thus larger production yield.

Keyword:

Crack GaN HV-LEDs production yield SU-8

Community:

  • [ 1 ] [Li, Shuguang]China Univ Petr East China, Coll Sci, Qingdao 266580, Shandong, Peoples R China
  • [ 2 ] [Lam, Kin-Tak]Fuzhou Univ, Inst Creat Ind Res, Fuzhou 361024, Fujian Province, Peoples R China
  • [ 3 ] [Huang, Wei-Chih]Natl Cheng Kung Univ, Inst Microelect, Tainan 70101, Taiwan
  • [ 4 ] [Chang, Shoou-Jinn]Natl Cheng Kung Univ, Inst Microelect, Tainan 70101, Taiwan
  • [ 5 ] [Huang, Wei-Chih]Natl Cheng Kung Univ, Dept Elect Engn, Adv Optoelect Technol Ctr, Tainan 70101, Taiwan
  • [ 6 ] [Chang, Shoou-Jinn]Natl Cheng Kung Univ, Dept Elect Engn, Adv Optoelect Technol Ctr, Tainan 70101, Taiwan

Reprint 's Address:

  • [Li, Shuguang]China Univ Petr East China, Coll Sci, Qingdao 266580, Shandong, Peoples R China

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Source :

JOURNAL OF DISPLAY TECHNOLOGY

ISSN: 1551-319X

Year: 2015

Issue: 4

Volume: 11

Page: 374-377

1 . 9 2 5

JCR@2015

1 . 5 3 0

JCR@2016

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 7

SCOPUS Cited Count: 8

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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