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author:

Xie, Bu-Gao (Xie, Bu-Gao.) [1] | Sun, Jian-Jun (Sun, Jian-Jun.) [2] (Scholars:孙建军) | Lin, Zhi-Bin (Lin, Zhi-Bin.) [3] | Clien, Guo-Nan (Clien, Guo-Nan.) [4] (Scholars:陈国南)

Indexed by:

EI Scopus SCIE

Abstract:

A cyanide-free silver plating bath containing uracil as a complexing, agent was investigated. The electrochemical properties of a silver complex were studied on a disk glassy carbon electrode by means of cyclic voltammetry and a rotating disk electrode. The brightness and adhesion of silver deposits obtained from this silver plating bath onto copper substrates in the absence and presence of polyethyleneimine (PEI) were evaluated. Mirror-bright and good adherent silver deposits could be obtained without a separate strike plating process when PEI as an additive was added. Differential capacitance studies indicated that competition adsorption between PEI and uracil molecules occurred on the silver surface. The electrochemical displacement rate of silver by base metal (e.g., copper.) was very slow compared with that in it typical cyanide strike bath from the results of electrochemical quartz crystal microbalance studies. The surface morphology of silver deposits characterized by scanning electron microscopy illustrated that, with the addition of PEI, the grain size of the deposits decreased from hundreds to tens of nanometers. (C) 2008 The Electrochemical Society. [DOI: 10.1149/1.3046157] All rights reserved.

Keyword:

Community:

  • [ 1 ] [Xie, Bu-Gao]Fuzhou Univ, Dept Chem, MOE, Key Lab Anal & Detect Technol Food Safety, Fuzhou 350002, Peoples R China
  • [ 2 ] [Sun, Jian-Jun]Fuzhou Univ, Dept Chem, MOE, Key Lab Anal & Detect Technol Food Safety, Fuzhou 350002, Peoples R China
  • [ 3 ] [Lin, Zhi-Bin]Fuzhou Univ, Dept Chem, MOE, Key Lab Anal & Detect Technol Food Safety, Fuzhou 350002, Peoples R China
  • [ 4 ] [Clien, Guo-Nan]Fuzhou Univ, Dept Chem, MOE, Key Lab Anal & Detect Technol Food Safety, Fuzhou 350002, Peoples R China

Reprint 's Address:

  • 谢步高

    [Xie, Bu-Gao]Fuzhou Univ, Dept Chem, MOE, Key Lab Anal & Detect Technol Food Safety, Fuzhou 350002, Peoples R China

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Source :

JOURNAL OF THE ELECTROCHEMICAL SOCIETY

ISSN: 0013-4651

Year: 2009

Issue: 3

Volume: 156

Page: D79-D83

2 . 2 4 1

JCR@2009

3 . 1 0 0

JCR@2023

ESI Discipline: CHEMISTRY;

JCR Journal Grade:1

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count: 37

SCOPUS Cited Count: 39

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

Online/Total:229/10000510
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