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author:

Zhou, Xiong-Tu (Zhou, Xiong-Tu.) [1] (Scholars:周雄图) | Zhang, Yong-Ai (Zhang, Yong-Ai.) [2] | Guo, Tai-Liang (Guo, Tai-Liang.) [3] (Scholars:郭太良)

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EI Scopus PKU CSCD

Abstract:

SiO2 micro-cantilever has been widely used in the field of chemical and biological sensors due to its high sensitivity. In order to further improve the dynamic sensitivity of SiO2 micro-cantilevers, the fabrication and its sensor application based on higher resonance modes are studied in this work. First, Silicon-on-insulator (SOI) is used as starting material for the fabrication of T-shaped SiO2 micro-cantilevers with different lengths. Then, commercial atom force microscopy (AFM) with accurate photoelectronic system is employed for the characterization of the frequency and the frequency shift before and after mass adsorption.It is found that the first three bending frequencies of the T-shaped SiO2 micro-cantilevers with total length of 250 μm are 18.86 kHz, 164.27 kHz and 467.25 kHz, respectively, which are well consistent with the simulated values. Moreover, for the same amount of mass change, the higher the flexural resonance mode is, the larger the frequency shift of the micro-cantilever will be, showing an increasing sensitivity. The frequency measurement of gold deposition reveals that the sensitivities of the first three modes are 1.36 Hz/pg, 9.78 Hz/pg and 26.92 Hz/pg, respectively. Immunological reactions are also conducted.It is found that at the second harmonic, a 21.5 pg mass absorption can be detected.

Keyword:

Atomic force microscopy Fabrication Frequency shift keying Nanocantilevers Resonance Sensors

Community:

  • [ 1 ] [Zhou, Xiong-Tu]School of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 2 ] [Zhang, Yong-Ai]School of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 3 ] [Guo, Tai-Liang]School of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China

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Source :

Journal of Optoelectronics Laser

ISSN: 1005-0086

CN: 12-1182/O4

Year: 2013

Issue: 11

Volume: 24

Page: 2055-2059

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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