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author:

Wu, Chaoxing (Wu, Chaoxing.) [1] (Scholars:吴朝兴) | Hu, Liqin (Hu, Liqin.) [2] | Su, Yijing (Su, Yijing.) [3] | Li, Yu (Li, Yu.) [4] | Guo, Tailiang (Guo, Tailiang.) [5] (Scholars:吴朝兴)

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EI Scopus PKU CSCD

Abstract:

Here, we address the technical problems and possible solutions of the voltage interference and charge accumulation in the under-gate field emission display (FED), fabricated with single-wall carbon nano-tube film emitters. The electron emission from the cathode sides was found to result in electron bombardment of the gate and a charge accumulation on its surface. A novel type of under-gate FED with a groove insulating layer (GIL) was designed to effectively eliminate the possibility of the side electron emission, and to enhance emission current. The emission characteristics of the prototyped under-gate FED with GIL structures fabricated in screen-printing technique, were evaluated. The results show that the voltage interference and charge accumulation were completely removed, and that the newly-developed FED shows good emission stability and gate modulation at a gate voltage ranging from 100 V to 250 V and an anode voltage of 600 V.

Keyword:

Electrons Electron tubes Field emission Field emission cathodes Field emission displays Secondary emission

Community:

  • [ 1 ] [Wu, Chaoxing]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 2 ] [Hu, Liqin]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 3 ] [Su, Yijing]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 4 ] [Li, Yu]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China
  • [ 5 ] [Guo, Tailiang]College of Physics and Information Engineering, Fuzhou University, Fuzhou 350002, China

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Source :

Journal of Vacuum Science and Technology

ISSN: 1672-7126

CN: 11-5177/TB

Year: 2011

Issue: 1

Volume: 31

Page: 12-16

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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