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author:

Guo, N. (Guo, N..) [1] | Liu, T. (Liu, T..) [2] | Luan, B. (Luan, B..) [3] | Wang, B. (Wang, B..) [4] | Liu, Q. (Liu, Q..) [5]

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EI

Abstract:

This study explores the dislocation density and configuration in fully pearlitic steel wires during the cold wire drawing process by X-ray diffraction (XRD) and transmission electron microscopy (TEM). The XRD results show that the dislocation density increases from 1·1×1014 m-2 to 1·4×1015 m-2, with the drawing strain increasing from 0 to 1·65. Measurement methods by XRD and TEM for the dislocation density are compared. Dislocation cells, walls and tangled dislocations are observed as the main dislocation substructures in ferrite lamellae. The dislocation cell size is related to the width of the ferrite lamellae, which is gradually reduced with increasing drawing strain. © W. S. Maney & Son Ltd. 2014.

Keyword:

Ferrite High resolution transmission electron microscopy Microstructure Pearlite Steel Strain Wire Wire drawing X ray diffraction

Community:

  • [ 1 ] [Guo, N.]School of Materials Science and Engineering, Chongqing University, Chongqing; 400044, China
  • [ 2 ] [Guo, N.]Faculty of Materials and Energy, Southwest University, Chongqing; 400715, China
  • [ 3 ] [Liu, T.]Faculty of Materials and Energy, Southwest University, Chongqing; 400715, China
  • [ 4 ] [Luan, B.]School of Materials Science and Engineering, Chongqing University, Chongqing; 400044, China
  • [ 5 ] [Wang, B.]School of Materials Science and Engineering, Fuzhou University, Fuzhou; 350108, China
  • [ 6 ] [Liu, Q.]School of Materials Science and Engineering, Chongqing University, Chongqing; 400044, China

Reprint 's Address:

  • [luan, b.]school of materials science and engineering, chongqing university, chongqing; 400044, china

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Source :

ISSN: 1432-8917

Year: 2014

Volume: 18

Page: S4249-S4254

Language: English

0 . 8 3

JCR@2014

0 . 8 3 0

JCR@2014

JCR Journal Grade:4

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 17

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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