SnS　films　with　thicknesses　of　65-580nm　have　been　deposited　on　glass　substrates　by　thermal　evaporation.　The　physical　properties　of　the　films　were　investigated　using　X-ray　diffraction,　scanning　electron　microscopy,　and　ultraviolet-visible-near　infrared　spectroscopy　measurements　at　room　temperature.　It　indicates　that　the　deposited　films　mainly　exhibit　SnS　phase,　but　they　contain　tiny　SnO2.　The　deposited　SnS　films　are　pinhole　free,　smooth　and　strongly　adherent　to　the　surface　of　the　substrate.　With　the　increase　of　the　film　thickness　from　65nm　to　580nm,　the　color　of　the　SnS　films　changes　from　brown　to　dark　brown　to　grey,　and　the　grains　of　the　films　become　larger　and　larger,　and　the　direct　bandgap　and　indirect　bandgap　decrease.　All　the　films　have　larger　direct　bandgap　of　1.55　-　2.30　eV,　which　is　much　larger　than　1.3　eV　of　bulk　SnS,　and　indirect　bandgap　of　1.10　-　1.29　eV.　©　2011　IEEE.