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Abstract:
The traditional luminance meter takes too much time to detect the backlight luminance so that it is hard to take bulk-production in the engineering practice. To solve these problems, the paper puts forward an evaluation method of backlight luminance uniformity based on ε-support vector regression. A backlight luminance uniformity testing platform is designed. First of all, a CCD image sensor is used in a single shot to get a digital image of several backlights, and the image is corrected. Secondly uses ε-support vector regression (ε-SVR) in the condition of nonlinear to test the luminance values of check points in backlights, and forecast the real luminance values of backlights. At last, it is compared with the testing standard to judge whether the backlights are qualified. The results show that the fusion of parameters can be tested in the constructed support vector regression. And their accuracy shows good similarity. RMSE of the best prediction is 43.28, BR is 1.21%. The error between the predicted results and these results of the measurements of the traditional luminance meter is much less, and it is easy to operate. The evaluation results of luminance meter are accorded with the method of the objective evaluation of the backlight luminance uniformity. © 2015, Science Press. All rights reserved.
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Chinese Journal of Liquid Crystals and Displays
ISSN: 1007-2780
CN: 22-1259/O4
Year: 2015
Issue: 5
Volume: 30
Page: 857-863
0 . 7 0 0
JCR@2023
Cited Count:
SCOPUS Cited Count: 5
ESI Highly Cited Papers on the List: 0 Unfold All
WanFang Cited Count:
Chinese Cited Count:
30 Days PV: 0
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