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author:

张树人 (张树人.) [1] | 陈国良 (陈国良.) [2] | 赵靖 (赵靖.) [3] | 郭太良 (郭太良.) [4]

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CQVIP

Abstract:

采用磁控溅射法在玻璃基底上制备了Cr-Cu-Al-Cr薄膜,用焊接法测试薄膜附着性能,用X射线衍射仪、原子力显微镜和台阶仪对薄膜进行表征,研究溅射过程中以及在高温大气环境下薄膜的防氧化方法,分析薄膜晶粒大小与电性能关系,制备出性能较好的导电膜。

Keyword:

晶粒 氧化 电学性能 附着性

Community:

  • [ 1 ] 福州大学物理与信息工程学院,福建福州350002

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Source :

真空电子技术

ISSN: 1002-8935

Year: 2007

Issue: 1

Page: 12-16

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count: -1

30 Days PV: 0

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