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author:

张树人 (张树人.) [1] | 陈国良 (陈国良.) [2] | 赵靖 (赵靖.) [3] | 郭太良 (郭太良.) [4] (Scholars:郭太良)

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Abstract:

采用磁控溅射法在玻璃基底上制备了Cr-Cu-Al-Cr薄膜,用焊接法测试薄膜附着性能,用X射线衍射仪、原子力显微镜和台阶仪对薄膜进行表征,研究溅射过程中以及在高温大气环境下薄膜的防氧化方法,分析薄膜晶粒大小与电性能关系,制备出性能较好的导电膜.

Keyword:

晶粒 氧化 电学性能 附着性

Community:

  • [ 1 ] [张树人]福州大学
  • [ 2 ] [陈国良]福州大学
  • [ 3 ] [赵靖]福州大学
  • [ 4 ] [郭太良]福州大学

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Source :

真空电子技术

ISSN: 1002-8935

CN: 11-2485/TN

Year: 2007

Issue: 1

Page: 12-16

Cited Count:

WoS CC Cited Count: 0

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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