Ce3+　or　Tb3+　single-doped　and　Ce3+/Tb3+　co-doped　oxyfluoride　scintillation　glass　samples　were　prepared　by　high　temperature　melting　method.　The　structures　were　analyzed　by　X-ray　diffraction　(XRD),　the　optical　and　luminescent　properties　were　studied　by　transmittance,　photoluminescence　excitation,　photoluminescence,　X-ray　excited　luminescence　(XEL)　and　fluorescence　decay.　The　luminescence　intensity　in　the　Ce3+/5　mol%　Tb3+　co-doped　(CT5)　glass　sample　under　304　nm　light　and　Xray　excitation　is　significantly　enhanced　compared　to　5　mol%　Tb3+　single-doped　(T5)　glass　sample.　The　maximum　integrated　XEL　intensity　of　CT5　glass　sample　is　about　67%　of　the　standard　Bi4Ge3O12　(BGO)　crystal.　Through　the　study　of　energy　transfer　mechanism,　the　results　indicate　that　there　is　an　energy　transfer　from　Gd3+　ions　or　Ce3+　ions　to　Tb3+　ions.　The　lifetime　of　CT5　glass　sample　is　2.13　ms.　The　obtained　results　confirm　that　CT5　glass　sample　could　be　a　promising　scintillating　material　used　in　X-ray　imaging.　So　we　have　demonstrated　X-ray　imaging　using　Ce3+/1–15　mol%　Tb3+　co-doped　(CT1-15)　glass　samples　and　confirmed　they　can　reach　a　spatial　resolution　of　10.0　lp/mm.　Further,　the　X-ray　imaging　effect　of　CT5　glass　sample　is　the　best,　and　the　capability　of　CT5　glass　sample　for　X-ray　imaging　application　is　confirmed.　©　2022　Elsevier　B.V.