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author:

Qian, F. (Qian, F..) [1] | Deng, J. (Deng, J..) [2] | Xu, C. (Xu, C..) [3] | Dong, Y. (Dong, Y..) [4] | Hu, L. (Hu, L..) [5] | Fu, G. (Fu, G..) [6] | Xie, Y. (Xie, Y..) [7] | Chang, P. (Chang, P..) [8] | Sun, J. (Sun, J..) [9] (Scholars:孙捷)

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Abstract:

Graphene has unique advantages in ultrabroadband detection. However, nowadays graphene-based photodetectors cannot meet the requirements for practical applications due to their poor performance. Here, we report a graphene−silicon−graphene Schottky junction photodetector assisted by field effect. Two separate graphene sheets are located on both sides of the n-doped silicon to form two opposite lateral series heterojunctions with silicon, and a transparent top gate is designed to modulate the Schottky barrier. Low doping concentration of silicon and negative gate bias can significantly raise the barrier height. Under the combined action of these two measures, the barrier height increases from 0.39 eV to 0.77 eV. Accordingly, the performance of the photodetector has been greatly improved. The photoresponsivity of the optimized device is 2.6 A/W at 792 nm, 1.8 A/W at 1064 nm, and 0.42 A/W at 1550 nm, and the on/off photo-switching ratio reaches 104. Our work provides a feasible solution for the development of graphene-based optoelectronic devices. © 2022 Optica Publishing Group under the terms of the Optica Open Access Publishing Agreement.

Keyword:

Community:

  • [ 1 ] [Qian, F.]Key Laboratory of Optoelectronics Technology, Ministry of Education, Beijing University of Technology, Beijing, 100124, China
  • [ 2 ] [Deng, J.]Key Laboratory of Optoelectronics Technology, Ministry of Education, Beijing University of Technology, Beijing, 100124, China
  • [ 3 ] [Xu, C.]Key Laboratory of Optoelectronics Technology, Ministry of Education, Beijing University of Technology, Beijing, 100124, China
  • [ 4 ] [Dong, Y.]Institute of Photonic Chips, University of Shanghai for Science and Technology, Shanghai, 200093, China
  • [ 5 ] [Hu, L.]Key Laboratory of Optoelectronics Technology, Ministry of Education, Beijing University of Technology, Beijing, 100124, China
  • [ 6 ] [Fu, G.]Fert Beijing Institute, School of Microelectronics, Beihang University, Beijing, 100191, China
  • [ 7 ] [Xie, Y.]Key Laboratory of Optoelectronics Technology, Ministry of Education, Beijing University of Technology, Beijing, 100124, China
  • [ 8 ] [Chang, P.]Key Laboratory of Optoelectronics Technology, Ministry of Education, Beijing University of Technology, Beijing, 100124, China
  • [ 9 ] [Sun, J.]National and Local United Engineering Laboratory of Flat Panel Display Technology, Fuzhou University, Mindu Innovation Laboratory, Fuzhou, 350100, China

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Source :

Optics Express

ISSN: 1094-4087

Year: 2022

Issue: 21

Volume: 30

Page: 38503-38512

3 . 8

JCR@2022

3 . 2 0 0

JCR@2023

ESI HC Threshold:55

JCR Journal Grade:2

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 2

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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