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author:

Wang, Q. (Wang, Q..) [1] | Wu, C. (Wu, C..) [2] | LaChance, A.M. (LaChance, A.M..) [3] | Zhou, J. (Zhou, J..) [4] | Gao, Y. (Gao, Y..) [5] | Zhang, Y. (Zhang, Y..) [6] | Sun, L. (Sun, L..) [7] | Cao, Y. (Cao, Y..) [8] | Liang, X. (Liang, X..) [9]

Indexed by:

Scopus

Abstract:

Polymer based dielectrics with excellent high electric field withstanding capability are of great significance for enhancing the power density and payload efficiency for both electrical and electronic systems. However, polymer-metal interface is prone to defect formation, leading to the dielectric aging and the initialization of electrical breakdown failure. A facile Montmorillonite (MMT) coating is self-co-assembled on the surface of P(VDF-HFP) high-k film to form hundreds of 2D nanosheets layers to impede the charge injection over the metal-polymer interface. The MMT coating increases the breakdown strength of the P(VDF-HFP) co-polymer film from 405 to 452 MV/m. The high field conduction study reveals a highly enhanced Schottky injection barrier that blocks the charge injection from electrodes to polymer bulk, leading to significantly suppressed charge injection and conduction loss in polymer. In addition, the introduction of MMT layered coating leads to prominent suppression of interfacial polarization loss, a phenomenon known as the blocking capacitance, which would otherwise stem from the accumulated charges of polymer-metal interface, by one order of magnitude, as demonstrated by the dielectric response analysis by using the Dissado-Hill model over a broad range of temperature and frequency. The superior charge injection and interfacial polarization suppression via the application of MMT coating impart the P(VDF-HFP) co-polymer film with higher breakdown strength, and provides an effective approach to develop high performance polymer dielectrics by interfacial engineering. This work provides insights into the understanding of the enhancement mechanism of 2D coating. © 2022

Keyword:

2D coating Dielectric film Dielectric response High field conduction Interfacial polarization P(VDF-HFP)

Community:

  • [ 1 ] [Wang, Q.]Department of Electrical Engineering, State Lab of Power System, Tsinghua University, Beijing, China
  • [ 2 ] [Wu, C.]Electrical Insulation Research Center, Institute of Materials Science, University of Connecticut, Storrs, CT, United States
  • [ 3 ] [LaChance, A.M.]Polymer Program, Institute of Materials Science and Department of Chemical & Biomolecular Engineering, University of Connecticut, Storrs, CT, United States
  • [ 4 ] [Zhou, J.]Electrical Insulation Research Center, Institute of Materials Science, University of Connecticut, Storrs, CT, United States
  • [ 5 ] [Gao, Y.]Department of Electrical Engineering, State Lab of Power System, Tsinghua University, Beijing, China
  • [ 6 ] [Gao, Y.]State Grid Jibei Electric Power Research Institute, North China Electric Power Research Institute Co., Beijing, China
  • [ 7 ] [Zhang, Y.]Department of Electrical Engineering, State Lab of Power System, Tsinghua University, Beijing, China
  • [ 8 ] [Zhang, Y.]College of Electrical Engineering and Automation, Fuzhou University, Fujian, Fuzhou, China
  • [ 9 ] [Sun, L.]Polymer Program, Institute of Materials Science and Department of Chemical & Biomolecular Engineering, University of Connecticut, Storrs, CT, United States
  • [ 10 ] [Cao, Y.]Electrical Insulation Research Center, Institute of Materials Science, University of Connecticut, Storrs, CT, United States
  • [ 11 ] [Liang, X.]Department of Electrical Engineering, State Lab of Power System, Tsinghua University, Beijing, China

Reprint 's Address:

  • [Cao, Y.]Electrical Insulation Research Center, United States

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Source :

Progress in Organic Coatings

ISSN: 0300-9440

Year: 2022

Volume: 172

6 . 6

JCR@2022

6 . 5 0 0

JCR@2023

ESI HC Threshold:91

JCR Journal Grade:1

CAS Journal Grade:1

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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