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author:

Zhao, Y. (Zhao, Y..) [1] | Xing, W. (Xing, W..) [2] | Ma, X. (Ma, X..) [3] | Yu, R. (Yu, R..) [4] | Meng, F. (Meng, F..) [5]

Indexed by:

Scopus

Abstract:

Interfacial engineering in oxide heterostructures has evolved into a thriving research field due to the presence of diverse novel physical phenomena. In this study, we grew epitaxial CuO thin films on a ZnO(0001) single crystal substrate, where the orientation relationship was CuO [110] (11̅1̅) || ZnO [112̅0] (0001). The atomic, magnetic, and electronic structures of the CuO/ZnO interface and the CuO(001) twin boundary were studied by combining aberration-corrected scanning transmission electron microscopy and first-principles calculations. The CuO/ZnO interface was found to be fully coherent and metallic, making it possible to form two-dimensional electron gas between the two semiconductors. © 2022

Keyword:

Copper oxide First-principles calculations Interface Scanning transmission electron microscopy Twin boundary

Community:

  • [ 1 ] [Zhao, Y.]Department of Physics, Beijing Engineering Research Center of Detection and Application for Weak Magnetic Field, University of Science and Technology Beijing, Beijing, 100083, China
  • [ 2 ] [Xing, W.]State Key Laboratory of Photocatalysis on Energy and Environment, College of Chemistry, Fuzhou University, Fuzhou, 350002, China
  • [ 3 ] [Ma, X.]Department of Physics, Beijing Engineering Research Center of Detection and Application for Weak Magnetic Field, University of Science and Technology Beijing, Beijing, 100083, China
  • [ 4 ] [Yu, R.]National Center for Electron Microscopy in Beijing, School of Materials Science and Engineering, Tsinghua University, Beijing, 100084, China
  • [ 5 ] [Meng, F.]Department of Physics, Beijing Engineering Research Center of Detection and Application for Weak Magnetic Field, University of Science and Technology Beijing, Beijing, 100083, China

Reprint 's Address:

  • [Xing, W.]State Key Laboratory of Photocatalysis on Energy and Environment, China

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Source :

Materials Today Communications

ISSN: 2352-4928

Year: 2022

Volume: 33

3 . 8

JCR@2022

3 . 7 0 0

JCR@2023

ESI HC Threshold:91

JCR Journal Grade:2

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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