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author:

Zhao, Yanan (Zhao, Yanan.) [1] | Xing, Wandong (Xing, Wandong.) [2] (Scholars:邢万东) | Ma, Xingqiao (Ma, Xingqiao.) [3] | Yu, Rong (Yu, Rong.) [4] | Meng, Fanyan (Meng, Fanyan.) [5]

Indexed by:

EI Scopus SCIE

Abstract:

Interfacial engineering in oxide heterostructures has evolved into a thriving research field due to the presence of diverse novel physical phenomena. In this study, we grew epitaxial CuO thin films on a ZnO(0001) single crystal substrate, where the orientation relationship was CuO [110] (111) || ZnO [1120] (0001). The atomic, magnetic, and electronic structures of the CuO/ZnO interface and the CuO(001) twin boundary were studied by combining aberration-corrected scanning transmission electron microscopy and first-principles calculations. The CuO/ZnO interface was found to be fully coherent and metallic, making it possible to form two-dimensional electron gas between the two semiconductors.

Keyword:

Copper oxide First-principles calculations Interface Scanning transmission electron microscopy Twin boundary

Community:

  • [ 1 ] [Zhao, Yanan]Univ Sci & Technol Beijing, Beijing Engn Res Ctr Detect & Applicat Weak Magnet, Dept Phys, Beijing 100083, Peoples R China
  • [ 2 ] [Ma, Xingqiao]Univ Sci & Technol Beijing, Beijing Engn Res Ctr Detect & Applicat Weak Magnet, Dept Phys, Beijing 100083, Peoples R China
  • [ 3 ] [Meng, Fanyan]Univ Sci & Technol Beijing, Beijing Engn Res Ctr Detect & Applicat Weak Magnet, Dept Phys, Beijing 100083, Peoples R China
  • [ 4 ] [Xing, Wandong]Fuzhou Univ, Coll Chem, State Key Lab Photocatalysis Energy & Environm, Fuzhou 350002, Peoples R China
  • [ 5 ] [Yu, Rong]Tsinghua Univ, Natl Ctr Electron Microscopy Beijing, Sch Mat Sci & Engn, Beijing 100084, Peoples R China

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Source :

MATERIALS TODAY COMMUNICATIONS

ISSN: 2352-4928

Year: 2022

Volume: 33

3 . 8

JCR@2022

3 . 7 0 0

JCR@2023

ESI Discipline: MATERIALS SCIENCE;

ESI HC Threshold:91

JCR Journal Grade:2

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 2

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