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author:

Lin, Ying (Lin, Ying.) [1] | Zhang, Yunxiao (Zhang, Yunxiao.) [2] (Scholars:张云霄) | Liu, Yuhao (Liu, Yuhao.) [3] | Wu, Kangning (Wu, Kangning.) [4] | Li, Helong (Li, Helong.) [5] | Wang, Jianing (Wang, Jianing.) [6] | Li, Kejie (Li, Kejie.) [7] | Ding, Lijian (Ding, Lijian.) [8]

Indexed by:

EI SCIE

Abstract:

Electric field stress concentration is one of the causes of partial discharge (PD) in power modules, which threatens the power modules' safe operation. Herein, this article investigates the influences of temperature (from 150 to 250 degrees C) and operation duration on the maximum electric field stress at the triple point (silicone elastomers, ceramic, and copper). It reveals that the maximum electric field stress rises with the increase in temperature, while the maximum electric field first increases but then decreases along the operation duration, especially under low temperature. Both the influences of temperature and the operation duration are related to the permittivity (dominated by the relaxation of Si-O bonds), low-frequency dispersion (LED) phenomenon, and dc conductivities of silicone elastomers, which can he manipulated to suppress electric field stress concentration. This article provides a method to accurately calculate the electric field. The results are also critical to evaluation and improvement of power modules' insulation.

Keyword:

Aging conductivity electric fields permittivity power electronics

Community:

  • [ 1 ] [Lin, Ying]Hefei Univ Technol, Sch Elect & Automation Engn, Hefei 230009, Peoples R China
  • [ 2 ] [Li, Helong]Hefei Univ Technol, Sch Elect & Automation Engn, Hefei 230009, Peoples R China
  • [ 3 ] [Wang, Jianing]Hefei Univ Technol, Sch Elect & Automation Engn, Hefei 230009, Peoples R China
  • [ 4 ] [Li, Kejie]Hefei Univ Technol, Sch Elect & Automation Engn, Hefei 230009, Peoples R China
  • [ 5 ] [Ding, Lijian]Hefei Univ Technol, Sch Elect & Automation Engn, Hefei 230009, Peoples R China
  • [ 6 ] [Lin, Ying]Hefei Comprehens Natl Sci Ctr, Inst Energy, Hefei 230031, Peoples R China
  • [ 7 ] [Li, Helong]Hefei Comprehens Natl Sci Ctr, Inst Energy, Hefei 230031, Peoples R China
  • [ 8 ] [Wang, Jianing]Hefei Comprehens Natl Sci Ctr, Inst Energy, Hefei 230031, Peoples R China
  • [ 9 ] [Li, Kejie]Hefei Comprehens Natl Sci Ctr, Inst Energy, Hefei 230031, Peoples R China
  • [ 10 ] [Ding, Lijian]Hefei Comprehens Natl Sci Ctr, Inst Energy, Hefei 230031, Peoples R China
  • [ 11 ] [Zhang, Yunxiao]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350108, Peoples R China
  • [ 12 ] [Liu, Yuhao]Tsinghua Univ, Grad Sch Shenzhen, Lab Adv Technol Elect Engn & Energy, Shenzhen 518055, Peoples R China
  • [ 13 ] [Wu, Kangning]Xi An Jiao Tong Univ, State Key Lab Elect Insulat & Power Equipment, Xian 710049, Peoples R China

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Source :

IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS

ISSN: 2168-6777

Year: 2022

Issue: 6

Volume: 10

Page: 7653-7664

5 . 5

JCR@2022

4 . 6 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:66

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count: 8

SCOPUS Cited Count: 15

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

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