Interconnector　is　a　critical　component　to　construct　solid　oxide　cells　(SOCs)　stack.　Oxidation　of　metallic　interconnectors　and　Cr　poisoning　caused　by　oxidation　are　important　factors　that　lead　to　long-term　performance　degradation　of　SOCs.　Coating　on　the　interconnector　surface　is　an　important　approach　to　inhibit　the　oxidation　and　Cr　migration　of　the　interconnector.　Herein,　(La0.75Sr0.25)0.95MnO3-delta　(LSM)　and　Mn1.5Co1.5O4　(MCO)　are　used　to　fabricate　the　coatings　of　interconnector.　Two　advanced　thermal　spray　technology,　atmospheric　plasma　spraying　(APS)　and　low-pressure　plasma　spray　(LPPS),　are　adopted　for　the　coating　preparation.　The　electrochemical　performance,　rising　and　cooling　cycle　stability,　and　Cr　diffusion　inhibition　performance　of　the　coatings　are　tested　and　evaluated.　The　result　indicates　that　MCO　can　generate　more　uniform　and　denser　coatings　than　LSM.　In　addition,　MCO　coatings　prepared　by　LPPS　shows　the　best　electrochemical　performance,　rising　and　cooling　cycle　stability,　and　Cr　diffusion　inhibition.　The　initial　area　specific　resistance　(ASR)　is　0.0027　omega　center　dot　cm2　at　800　degrees　C.　After　4　cooling　cycle　tests,　the　ASR　increases　to　0.0032　omega　center　dot　cm2　but　lower　than　other　samples.　Meanwhile,　the　relative　intense　of　Cr　at　the　interface　of　SUS430　with　MCO　coatings　fabricated　by　LPPS　is　lower　than　that　of　MCO　fabricated　by　APS　after　4　rising　and　cooling　cycle　operations,　showing　more　favorable　Cr　diffusion　inhibition　performance.