• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
成果搜索

author:

Chen, Zhiwen (Chen, Zhiwen.) [1] | Pan, Dengyu (Pan, Dengyu.) [2] | Li, Zhen (Li, Zhen.) [3] | Jiao, Zheng (Jiao, Zheng.) [4] | Wu, Minghong (Wu, Minghong.) [5] (Scholars:吴明红) | Shek, Chan-Hung (Shek, Chan-Hung.) [6] | Wu, C. M. Lawrence (Wu, C. M. Lawrence.) [7] | Lai, Joseph K. L. (Lai, Joseph K. L..) [8]

Indexed by:

SCIE

Abstract:

Semiconductor germanium (Ge) in contact with some metals, such as Al, Pd, and Au, etc., is a class of distinctive materials with non-integer dimensions (D) that differ from integer dimensional materials, such as nanoparticles (0D), nanowires/nanorods//nanotubes/nanoribbons (1D), and thin films (2D). In this article, we describe our efforts toward understanding the annealing strategies and perspectives of metal-induced crystallization for the amorphous Ge embedded in Al, Pd, and Au matrices prepared by high vacuum thermal evaporation techniques, highlighting contributions from our laboratory. First, we present the Al-induced crystallization of amorphous Ge and formation processes of fractal Ge patterns. In addition, the fractal Ge patterns induced by Pd nanoparticles with solid-state reactions will be summarized in detail. Temperature-dependent properties of resistance and fractal dimension in Pd/Ge bilayer films will be expounded. In particular, the nonlinear optical properties are discussed in detail. Finally, we will emphasize the in situ observations by transmission electron microscopy and multi-fractal analysis for the fractal Ge patterns induced by Au nanoparticles. Moreover, the polycondensation-type fractal Ge patterns with non-integer dimensions, thick branches and smooth edges, and metastable gamma-Au0.6Ge0.4 are further investigated. The computer simulation indicated that the experimental results are good agreement with the simulation patterns, which were carried out by a ripening mechanism of non uniform grains. This review may provide a novel insight to modulate their competent performance and promote rational design of micro/nanodevices.

Keyword:

aluminum amorphous annealing fractal pattern germanium gold metal-induced crystallization microstructure nanostructure palladium

Community:

  • [ 1 ] [Chen, Zhiwen]Shanghai Univ, Shanghai Appl Radiat Inst, Shanghai 200444, Peoples R China
  • [ 2 ] [Li, Zhen]Shanghai Univ, Shanghai Appl Radiat Inst, Shanghai 200444, Peoples R China
  • [ 3 ] [Jiao, Zheng]Shanghai Univ, Shanghai Appl Radiat Inst, Shanghai 200444, Peoples R China
  • [ 4 ] [Wu, Minghong]Shanghai Univ, Shanghai Appl Radiat Inst, Shanghai 200444, Peoples R China
  • [ 5 ] [Chen, Zhiwen]City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon Tong, Hong Kong, Peoples R China
  • [ 6 ] [Shek, Chan-Hung]City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon Tong, Hong Kong, Peoples R China
  • [ 7 ] [Wu, C. M. Lawrence]City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon Tong, Hong Kong, Peoples R China
  • [ 8 ] [Lai, Joseph K. L.]City Univ Hong Kong, Dept Phys & Mat Sci, Kowloon Tong, Hong Kong, Peoples R China
  • [ 9 ] [Pan, Dengyu]Shanghai Univ, Inst Nanochem & Nanobiol, Sch Environm & Chem Engn, Shanghai 200444, Peoples R China
  • [ 10 ] [Jiao, Zheng]Shanghai Univ, Inst Nanochem & Nanobiol, Sch Environm & Chem Engn, Shanghai 200444, Peoples R China
  • [ 11 ] [Wu, Minghong]Shanghai Univ, Inst Nanochem & Nanobiol, Sch Environm & Chem Engn, Shanghai 200444, Peoples R China

Reprint 's Address:

Show more details

Related Keywords:

Source :

CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES

ISSN: 1040-8436

Year: 2014

Issue: 5

Volume: 39

Page: 368-390

6 . 4 5

JCR@2014

8 . 1 0 0

JCR@2023

JCR Journal Grade:1

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 3

Affiliated Colleges:

Online/Total:115/10046569
Address:FZU Library(No.2 Xuyuan Road, Fuzhou, Fujian, PRC Post Code:350116) Contact Us:0591-22865326
Copyright:FZU Library Technical Support:Beijing Aegean Software Co., Ltd. 闽ICP备05005463号-1