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author:

Cui, Mengkuo (Cui, Mengkuo.) [1] | Zhou, Jiuren (Zhou, Jiuren.) [2] | Zheng, Siying (Zheng, Siying.) [3] | Liu, Ning (Liu, Ning.) [4] | Liang, Jie (Liang, Jie.) [5] | Hu, Wei (Hu, Wei.) [6] (Scholars:胡炜) | Liu, Yan (Liu, Yan.) [7] | Hao, Yue (Hao, Yue.) [8] | Han, Genquan (Han, Genquan.) [9]

Indexed by:

EI Scopus SCIE

Abstract:

We propose a novel technology called depolarization field engineered ferroelectric mechanical transistor (Fe-MT), which achieves an exceptionally low operating voltage (V-DD) of 0.3 volts. This achievement of VDD scaling is made possible by utilizing depolarization voltage with an amplitude of 11/-11.1 V for the pre-shrinkage of contact gap (g(C)) [Fig. 1], which is activated by a + 63/-66 V pulse stimulus. Additionally, our Fe-MTs maintain the device level reconfigurability between N/P modes. This exciting development suggests that our Fe-MTs can serve as the fundamental building blocks for future generations of integrated circuits with high energy and area-efficiency.

Keyword:

depolarization field Ferroelectric Ferroelectric devices micro-electro-mechanical (MEM) Micromechanical devices operating voltage reconfigurability Reconfigurable devices Transistors Voltage

Community:

  • [ 1 ] [Cui, Mengkuo]Xidian Univ, Hangzhou Inst Technol, Hangzhou 311200, Peoples R China
  • [ 2 ] [Zhou, Jiuren]Xidian Univ, Hangzhou Inst Technol, Hangzhou 311200, Peoples R China
  • [ 3 ] [Zheng, Siying]Xidian Univ, Hangzhou Inst Technol, Hangzhou 311200, Peoples R China
  • [ 4 ] [Liu, Ning]Xidian Univ, Hangzhou Inst Technol, Hangzhou 311200, Peoples R China
  • [ 5 ] [Liu, Yan]Xidian Univ, Hangzhou Inst Technol, Hangzhou 311200, Peoples R China
  • [ 6 ] [Hao, Yue]Xidian Univ, Hangzhou Inst Technol, Hangzhou 311200, Peoples R China
  • [ 7 ] [Han, Genquan]Xidian Univ, Hangzhou Inst Technol, Hangzhou 311200, Peoples R China
  • [ 8 ] [Cui, Mengkuo]Xidian Univ, Sch Microelect, Xian 710126, Peoples R China
  • [ 9 ] [Zhou, Jiuren]Xidian Univ, Sch Microelect, Xian 710126, Peoples R China
  • [ 10 ] [Zheng, Siying]Xidian Univ, Sch Microelect, Xian 710126, Peoples R China
  • [ 11 ] [Liu, Ning]Xidian Univ, Sch Microelect, Xian 710126, Peoples R China
  • [ 12 ] [Liu, Yan]Xidian Univ, Sch Microelect, Xian 710126, Peoples R China
  • [ 13 ] [Hao, Yue]Xidian Univ, Sch Microelect, Xian 710126, Peoples R China
  • [ 14 ] [Han, Genquan]Xidian Univ, Sch Microelect, Xian 710126, Peoples R China
  • [ 15 ] [Liang, Jie]Shanghai Univ, Sch Microelect, Shanghai 201800, Peoples R China
  • [ 16 ] [Hu, Wei]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350108, Peoples R China

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Source :

IEEE ELECTRON DEVICE LETTERS

ISSN: 0741-3106

Year: 2023

Issue: 12

Volume: 44

Page: 2063-2066

4 . 1

JCR@2023

4 . 1 0 0

JCR@2023

JCR Journal Grade:2

CAS Journal Grade:2

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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