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author:

Su, J.-N. (Su, J.-N..) [1] | Fan, G. (Fan, G..) [2] | Gan, M. (Gan, M..) [3] | Chen, G.-Y. (Chen, G.-Y..) [4] | Guo, W. (Guo, W..) [5] | Chen, C.L.P. (Chen, C.L.P..) [6]

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Scopus

Abstract:

Single Image Super-Resolution (SISR) aims to reconstruct a high-resolution image from its corresponding low-resolution input. A common technique to enhance the reconstruction quality is Non-Local Attention (NLA), which leverages self-similar texture patterns in images. However, we have made a novel finding that challenges the prevailing wisdom. Our research reveals that NLA can be detrimental to SISR and even produce severely distorted textures. For example, when dealing with severely degrade textures, NLA may generate unrealistic results due to the inconsistency of non-local texture patterns. This problem is overlooked by existing works, which only measure the average reconstruction quality of the whole image, without considering the potential risks of using NLA. To address this issue, we propose a new perspective for evaluating the reconstruction quality of NLA, by focusing on the sub-pixel level that matches the pixel-wise fusion manner of NLA. From this perspective, we provide the approximate reconstruction performance upper bound of NLA, which guides us to design a concise yet effective Texture-Fidelity Strategy (TFS) to mitigate the degradation caused by NLA. Moreover, the proposed TFS can be conveniently integrated into existing NLA-based SISR models as a general building block. Based on the TFS, we develop a Deep Texture-Fidelity Network (DTFN), which achieves state-of-The-Art performance for SISR. Our code and a pre-Trained DTFN are available on GitHub for verification.  © 1979-2012 IEEE.

Keyword:

Deep Learning Non-Local Attention Self-Similarity Single Image Super-Resolution

Community:

  • [ 1 ] [Su J.-N.]Putian University, New Engineering Industry College, Putian, Fujian, 351100, China
  • [ 2 ] [Su J.-N.]College of Computer and Data Sciencem, Fuzhou University, Fujian, Fuzhou, 350108, China
  • [ 3 ] [Su J.-N.]Putian University, Putian Electronic Information Industry Technology Research Institute, Putian, Fujian, 351100, China
  • [ 4 ] [Fan G.]College of Computer Science and Technology, Qingdao University, Qingdao, 266071, China
  • [ 5 ] [Fan G.]The Institute for Future, Qingdao University, Qingdao, 266071, China
  • [ 6 ] [Gan M.]College of Computer Science and Technology, Qingdao University, Qingdao, 266071, China
  • [ 7 ] [Gan M.]The Institute for Future, Qingdao University, Qingdao, 266071, China
  • [ 8 ] [Chen G.-Y.]College of Computer and Data Sciencem, Fuzhou University, Fujian, Fuzhou, 350108, China
  • [ 9 ] [Chen G.-Y.]Fuzhou University, College of Computer and Data Science, Fuzhou, 350108, China
  • [ 10 ] [Chen G.-Y.]Key Laboratory of Intelligent Metro of Universities in Fujian, Fujian Key Laboratory of Network Computing and Intelligent Information Processing, China
  • [ 11 ] [Guo W.]College of Computer and Data Sciencem, Fuzhou University, Fujian, Fuzhou, 350108, China
  • [ 12 ] [Guo W.]Fuzhou University, College of Computer and Data Science, Fuzhou, 350108, China
  • [ 13 ] [Guo W.]Key Laboratory of Intelligent Metro of Universities in Fujian, Fujian Key Laboratory of Network Computing and Intelligent Information Processing, China
  • [ 14 ] [Chen C.L.P.]College of Computer Science and Technology, Qingdao University, Qingdao, 266071, China
  • [ 15 ] [Chen C.L.P.]The College of Computer Science and Technology, Qingdao University, Qingdao, 266071, China
  • [ 16 ] [Chen C.L.P.]The School of Computer Science and Engineering, South China University of Technology, Guangzhou, 510641, China

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Source :

IEEE Transactions on Pattern Analysis and Machine Intelligence

ISSN: 0162-8828

Year: 2024

Issue: 12

Volume: 46

Page: 11476-11490

2 0 . 8 0 0

JCR@2023

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ESI Highly Cited Papers on the List: 0 Unfold All

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30 Days PV: 1

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