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author:

Ma, Xiao (Ma, Xiao.) [1] | Zhuang, Bingyong (Zhuang, Bingyong.) [2] | Chen, Huipeng (Chen, Huipeng.) [3] (Scholars:陈惠鹏)

Indexed by:

EI Scopus SCIE

Abstract:

Flexible organic synaptic transistors (FOSTs) are crucial for neuromorphic computing due to their flexibility and biocompatibility, yet their mechanical stability under strain is underexplored. This study enhances FOST resilience by optimizing the neutral-axis alignment through layer thickness adjustments and incorporation of a polyimide layer, aligning the axis closer to the heterojunction interface. This strategy significantly reduces strain-induced defects, minimizing excitatory postsynaptic current (EPSC) degradation from 21.19% to 13.34% after 100 bending cycles. Optimized FOSTs demonstrate a remarkable pattern recognition accuracy of 90.4% after bending, significantly outperforming the 76.8% achieved by standard devices. These findings present a straightforward and effective approach to improve the mechanical stability and synaptic performance of FOSTs, advancing the development of durable bio-inspired computing systems.

Keyword:

Accuracy Bending Films Flexible synaptic transistor mechanical stability Neuromorphics neutral axis pattern recognition Pattern recognition Performance evaluation Strain Substrates Thermal stability Transistors

Community:

  • [ 1 ] [Ma, Xiao]Fuzhou Univ, Inst Optoelect Display, Natl & Local United Engn Lab Flat Panel Display Te, Fuzhou 350002, Peoples R China
  • [ 2 ] [Zhuang, Bingyong]Fuzhou Univ, Inst Optoelect Display, Natl & Local United Engn Lab Flat Panel Display Te, Fuzhou 350002, Peoples R China
  • [ 3 ] [Chen, Huipeng]Fuzhou Univ, Inst Optoelect Display, Natl & Local United Engn Lab Flat Panel Display Te, Fuzhou 350002, Peoples R China

Reprint 's Address:

  • 陈惠鹏

    [Chen, Huipeng]Fuzhou Univ, Inst Optoelect Display, Natl & Local United Engn Lab Flat Panel Display Te, Fuzhou 350002, Peoples R China

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Source :

IEEE ELECTRON DEVICE LETTERS

ISSN: 0741-3106

Year: 2025

Issue: 3

Volume: 46

Page: 444-447

4 . 1 0 0

JCR@2023

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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