• Complex
  • Title
  • Keyword
  • Abstract
  • Scholars
  • Journal
  • ISSN
  • Conference
成果搜索

author:

Ma, Xiao (Ma, Xiao.) [1] | Zhuang, Bingyong (Zhuang, Bingyong.) [2] | Chen, Huipeng (Chen, Huipeng.) [3]

Indexed by:

EI

Abstract:

Flexible organic synaptic transistors (FOSTs) are crucial for neuromorphic computing due to their flexibility and biocompatibility, yet their mechanical stability under strain is underexplored. This study enhances FOST resilience by optimizing the neutral-axis alignment through layer thickness adjustments and incorporation of a polyimide layer, aligning the axis closer to the heterojunction interface. This strategy significantly reduces strain-induced defects, minimizing excitatory postsynaptic current (EPSC) degradation from 21.19% to 13.34% after 100 bending cycles. Optimized FOSTs demonstrate a remarkable pattern recognition accuracy of 90.4% after bending, significantly outperforming the 76.8% achieved by standard devices. These findings present a straightforward and effective approach to improve the mechanical stability and synaptic performance of FOSTs, advancing the development of durable bio-inspired computing systems. © 1980-2012 IEEE.

Keyword:

Flexible electronics Fracture mechanics Phase locked loops

Community:

  • [ 1 ] [Ma, Xiao]Institute of Optoelectronic Display, National and Local United Engineering Laboratory of Flat Panel Display Technology, Fuzhou University, Fuzhou; 350002, China
  • [ 2 ] [Zhuang, Bingyong]Institute of Optoelectronic Display, National and Local United Engineering Laboratory of Flat Panel Display Technology, Fuzhou University, Fuzhou; 350002, China
  • [ 3 ] [Chen, Huipeng]Institute of Optoelectronic Display, National and Local United Engineering Laboratory of Flat Panel Display Technology, Fuzhou University, Fuzhou; 350002, China

Reprint 's Address:

  • [chen, huipeng]institute of optoelectronic display, national and local united engineering laboratory of flat panel display technology, fuzhou university, fuzhou; 350002, china;;

Show more details

Related Keywords:

Related Article:

Source :

IEEE Electron Device Letters

ISSN: 0741-3106

Year: 2025

Issue: 3

Volume: 46

Page: 444-447

4 . 1 0 0

JCR@2023

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

Affiliated Colleges:

Online/Total:766/10050091
Address:FZU Library(No.2 Xuyuan Road, Fuzhou, Fujian, PRC Post Code:350116) Contact Us:0591-22865326
Copyright:FZU Library Technical Support:Beijing Aegean Software Co., Ltd. 闽ICP备05005463号-1