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author:

Wen, Z. (Wen, Z..) [1] | Zhang, X. (Zhang, X..) [2] | Wang, P. (Wang, P..) [3] | Huang, F. (Huang, F..) [4] | Chen, Z. (Chen, Z..) [5] | Li, Q. (Li, Q..) [6] | Pan, L. (Pan, L..) [8] | Bu, Y. (Bu, Y..) [9] | Dai, N. (Dai, N..) [10] | Shao, Y. (Shao, Y..) [11]

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Scopus

Abstract:

Tailoring the wavelength, bandwidth, directionality, and polarization of thermal radiation is critical for various applications like infrared camouflage, radiative cooling, and gas sensing. In this work, we present a deep-subwavelength bilayer structure that serves as a long-wavelength infrared (LWIR) narrow-band thermal emitter with polarization selectivity. The proposed LWIR thermal emitter basically consists of a tungsten oxide (WO3) polar dielectric layer upon an opaque gold (Au) ground plane. Transfer matrix method (TMM) calculations are employed to analytically investigate the optical responses of the thermal emitter. Leveraging the Berreman mode near longitudinal optical (LO) phonon energy of WO3, the thermal emitter experimentally realizes high absorption (97.6%) for the TM-polarized state and low absorption (4.2%) for the TE-polarized state (at an incident angle of 60° and a wavelength of 10.12 μm), which shows good agreement with theoretical results. Such excellent polarization-sensitive performance makes our LWIR thermal emitter very promising for optical security features, information encryption, and anticounterfeiting. © 2025 American Chemical Society.

Keyword:

Berreman mode infrared anticounterfeiting long-wavelength infrared polarization-sensitive thermal emitter

Community:

  • [ 1 ] [Wen Z.]Laboratory of Thin Film Optics, Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, 201800, China
  • [ 2 ] [Zhang X.]Laboratory of Thin Film Optics, Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, 201800, China
  • [ 3 ] [Zhang X.]Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou, 310024, China
  • [ 4 ] [Wang P.]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, 350108, China
  • [ 5 ] [Huang F.]School of Mechanical Engineering and Automation, Fuzhou University, Fuzhou, 350108, China
  • [ 6 ] [Chen Z.]State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, 200083, China
  • [ 7 ] [Li Q.]State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, 200083, China
  • [ 8 ] [Zhang X.]Laboratory of Thin Film Optics, Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, 201800, China
  • [ 9 ] [Pan L.]Laboratory of Thin Film Optics, Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, 201800, China
  • [ 10 ] [Bu Y.]Laboratory of Thin Film Optics, Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, 201800, China
  • [ 11 ] [Dai N.]Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou, 310024, China
  • [ 12 ] [Dai N.]State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, 200083, China
  • [ 13 ] [Shao Y.]Laboratory of Thin Film Optics, Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, 201800, China
  • [ 14 ] [Shao Y.]Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou, 310024, China

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Source :

ACS Applied Optical Materials

ISSN: 2771-9855

Year: 2025

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ESI Highly Cited Papers on the List: 0 Unfold All

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30 Days PV: 0

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