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author:

Hu, Wanxue (Hu, Wanxue.) [1] | Huang, Zezhou (Huang, Zezhou.) [2] | Shen, Yuheng (Shen, Yuheng.) [3] | Lai, Yu (Lai, Yu.) [4] | Shen, Kunching (Shen, Kunching.) [5]

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Abstract:

This study introduces the current transport mechanism in electron mobility transistors (HEMTs), focusing specifically on the operating state and current transfer process of multi two-dimensional electron gas (2DEG) channels. In comparison to single-channel HEMT, this multi-channel HEMT increases the current density by over six times, offering significant potential for devices in the high-power domain. It further presents an equivalent circuit model. This model corresponds closely to the proposed multi-channel structure and has been thoroughly validated. This study provides an explanation of the current transfer mechanism within the multi channels, paving a way for advancements in high-power device applications. © Published under licence by IOP Publishing Ltd.

Keyword:

Aluminum gallium nitride Electron mobility Equivalent circuits Gallium nitride High electron mobility transistors III-V semiconductors Power HEMT Two dimensional electron gas

Community:

  • [ 1 ] [Hu, Wanxue]College of Physics and Information Engineering, Fuzhou University, Fujian, Fuzhou; 350108, China
  • [ 2 ] [Huang, Zezhou]College of Physics and Information Engineering, Fuzhou University, Fujian, Fuzhou; 350108, China
  • [ 3 ] [Shen, Yuheng]College of Physics and Information Engineering, Fuzhou University, Fujian, Fuzhou; 350108, China
  • [ 4 ] [Lai, Yu]College of Physics and Information Engineering, Fuzhou University, Fujian, Fuzhou; 350108, China
  • [ 5 ] [Shen, Kunching]College of Physics and Information Engineering, Fuzhou University, Fujian, Fuzhou; 350108, China

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ISSN: 1742-6588

Year: 2025

Issue: 1

Volume: 3080

Language: English

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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