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author:

Wang, Haoyang (Wang, Haoyang.) [1] | Xu, Feng (Xu, Feng.) [2] | Gao, Yuan (Gao, Yuan.) [3] | Zhu, Weiguo (Zhu, Weiguo.) [4] | Jiao, Yitong (Jiao, Yitong.) [5] | Liu, Yifei (Liu, Yifei.) [6] | Wang, Yaqi (Wang, Yaqi.) [7] | Dai, Shuheng (Dai, Shuheng.) [8] | Li, Wangyue (Li, Wangyue.) [9] | Li, Ruizi (Li, Ruizi.) [10] | Zhu, Jixin (Zhu, Jixin.) [11]

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EI

Abstract:

Scintillators are the core components of real-time dynamic computed tomography (CT), and their performance directly affects the radiation dose used and the quality of the output images. Self-trapped exciton scintillators are expected to resolve the trade-off between low radiation dose rates and high spatial resolution. However, the reported self-trapped exciton scintillators lack systematic design ideas and the ambiguity of the emission mechanism limits their further application in X-ray imaging. Here, a molecular confinement strategy to reduce the electronic dimension by introducing organic molecules with large ionic radii is proposed and applied to design (TPA)2Cu2I4 with dual self-trapped excitons (D-STEs). The D-STEs originating from Jahn-Teller-like distortion due to multiple electron-phonon coupling enable (TPA)2Cu2I4 to exhibit a high PLQY of 92 %, a high light yield of 74,000 photons·MeV−1 and a low detection limit of 53.1 nGyair·s−1. In addition, the (TPA)2Cu2I4 scintillation films also display excellent imaging quality, with a spatial resolution of 14.1 lp·mm−1. Impressively, a real-time dynamic X-ray imaging system based on D-STEs scintillators is established for the first time by coupling with a thin-film transistor array, verifying its reliability in nondestructive testing scenarios. In conclusion, the D-STEs scintillators created by molecular confinement have broad commercial application prospects. © 2025

Keyword:

Computerized tomography Dosimetry Dynamics Economic and social effects Excitons Image resolution Imaging systems Iodine compounds Molecular imaging Molecules Nondestructive examination Quantum theory Scintillation counters Thin film circuits Thin films Thin film transistors X ray analysis

Community:

  • [ 1 ] [Wang, Haoyang]State Key Laboratory of Flexible Electronics (LOFE) & Institute of Flexible Electronics (IFE), Northwestern Polytechnical University, 127 West Youyi Road, Xi'an; 710072, China
  • [ 2 ] [Xu, Feng]State Key Laboratory of Flexible Electronics (LOFE) & Institute of Flexible Electronics (IFE), Northwestern Polytechnical University, 127 West Youyi Road, Xi'an; 710072, China
  • [ 3 ] [Gao, Yuan]State Key Laboratory of Flexible Electronics (LOFE) & Institute of Flexible Electronics (IFE), Northwestern Polytechnical University, 127 West Youyi Road, Xi'an; 710072, China
  • [ 4 ] [Zhu, Weiguo]State Key Laboratory of Flexible Electronics (LOFE) & Institute of Flexible Electronics (IFE), Northwestern Polytechnical University, 127 West Youyi Road, Xi'an; 710072, China
  • [ 5 ] [Jiao, Yitong]State Key Laboratory of Flexible Electronics (LOFE) & Institute of Flexible Electronics (IFE), Northwestern Polytechnical University, 127 West Youyi Road, Xi'an; 710072, China
  • [ 6 ] [Liu, Yifei]School of mechanical engineering, Northwestern Polytechnical University, 127 West Youyi Road, Xi'an; 710072, China
  • [ 7 ] [Wang, Yaqi]State Key Laboratory of Flexible Electronics (LOFE) & Institute of Flexible Electronics (IFE), Northwestern Polytechnical University, 127 West Youyi Road, Xi'an; 710072, China
  • [ 8 ] [Dai, Shuheng]MOE Key Laboratory for Analytical Science of Food Safety and Biology and State Key Laboratory of Photocatalysis on Energy and Environment, College of Chemistry, Fuzhou University, Fuzhou; 350108, China
  • [ 9 ] [Li, Wangyue]State Key Laboratory of Flexible Electronics (LOFE) & Institute of Flexible Electronics (IFE), Northwestern Polytechnical University, 127 West Youyi Road, Xi'an; 710072, China
  • [ 10 ] [Li, Ruizi]State Key Laboratory of Flexible Electronics (LOFE) & Institute of Flexible Electronics (IFE), Northwestern Polytechnical University, 127 West Youyi Road, Xi'an; 710072, China
  • [ 11 ] [Zhu, Jixin]State Key Laboratory of Fire Science, University of Science and Technology of China, 443 Huangshan Road, Hefei; 230027, China

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Source :

Applied Materials Today

ISSN: 2352-9407

Year: 2025

Volume: 46

7 . 2 0 0

JCR@2023

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ESI Highly Cited Papers on the List: 0 Unfold All

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30 Days PV: 0

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