In　thin-film　transistors　(TFTs),　issues　such　as　interface　states　may　lead　to　unstable　device　performance　and　complex　physical　phenomena,　such　as　frequency　dispersion　effects.　This　paper　establishes　a　three-terminal　TFT　compact　model　capable　of　replicating　capacitance　dispersion　phenomena　and　directly　applying　to　SPICE　circuit　simulations.　The　model　decomposes　the　transistor＇s　capacitance　frequency　response　into　the　superposition　of　responses　from　different　electronic　states.　The　different　electronic　states　are　emulated　by　parallel　branches,　each　composed　of　voltage-dependent　capacitance　and　resistance　connected　in　series.　The　Powell　algorithm　is　employed　to　achieve　automatic　parameter　optimization.　The　model　is　generic　for　TFTs　and　successfully　replicates　capacitance　dispersion　phenomena　in　carbon　nanotube　(CNT)　and　indium-gallium-zinc-oxide　(IGZO)　thin-film　transistors.　This　work　provides　insights　to　the　circuit　behavior　of　display　driver　circuits　at　high　frequencies　and　improving　circuit　reliability.　©　2024　John　Wiley　and　Sons　Inc.　All　rights　reserved.