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author:

Hu, Wei (Hu, Wei.) [1] (Scholars:胡炜) | Wei, Rongshan (Wei, Rongshan.) [2] (Scholars:魏榕山)

Indexed by:

EI Scopus SCIE

Abstract:

The nonlinearity characteristics of memristor have been widely employed in artificial intelligence. However, existing studies do not provide much attention to the analytic analysis of nonlinearity. This paper presents an analytic approach to the nonlinearity of memristor by analyzing the output spectrumbased on homotopy analysis method (HAM). The analytic spectrum expressions obtained by this approach are verified by the fingerprints of memristor. It can be simultaneously revealed that one of the potential sources of the nonlinearity is the large variation of state variable. Furthermore, we propose a mapping method based on the obtained total harmonic distortion (THD) and a new parameter-threshold frequency omega(C) to investigate the relationship between thememristor transition (i.e., the transition of the memristor between a nonlinear resistor and a linear resistor) and the frequency of input signal. Especially, analytic output spectrum, THD, and threshold frequency omega(C) can be solved without complex mathematical operations and, thus, compared with traditional works, the complexity of the proposed approach is reduced.

Keyword:

Analytic approximate solution homotopy analysis method (HAM) memristor nonlinearity spectrum analysis threshold frequency total harmonic distortion (THD)

Community:

  • [ 1 ] [Hu, Wei]Fuzhou Univ, Sch Phys & Informat Engn, Fuzhou 350116, Fujian, Peoples R China
  • [ 2 ] [Wei, Rongshan]Fuzhou Univ, Sch Phys & Informat Engn, Fuzhou 350116, Fujian, Peoples R China

Reprint 's Address:

  • 魏榕山

    [Wei, Rongshan]Fuzhou Univ, Sch Phys & Informat Engn, Fuzhou 350116, Fujian, Peoples R China

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Source :

IEEE TRANSACTIONS ON ELECTRON DEVICES

ISSN: 0018-9383

Year: 2019

Issue: 6

Volume: 66

Page: 2589-2594

2 . 9 1 3

JCR@2019

2 . 9 0 0

JCR@2023

ESI Discipline: ENGINEERING;

ESI HC Threshold:150

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 5

SCOPUS Cited Count: 5

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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