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author:

Xu, Canhua (Xu, Canhua.) [1] (Scholars:许灿华) | Xu, Qifeng (Xu, Qifeng.) [2] | Ma, Jing (Ma, Jing.) [3] (Scholars:马靖) | Xie, Nan (Xie, Nan.) [4] (Scholars:谢楠)

Indexed by:

EI Scopus SCIE

Abstract:

An aluminum grating with period of 152 nm is designed and manufactured based on rigorous coupled wave analysis. Its transmissions of TM and TE waves are measured at 532 nm, 632.8 nm and 810 nm, respectively. From the agreement between the experimental results and simulations, a grating thickness of 80 +/- 5 nm can be determined. The analysis of and experiments on the grating temperature dependence reveal its thermal stability in ambient conditions.

Keyword:

polarization characteristics subwavelength aluminum grating temperature dependence

Community:

  • [ 1 ] [Xu, Canhua]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350002, Peoples R China
  • [ 2 ] [Xu, Qifeng]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350002, Peoples R China
  • [ 3 ] [Xie, Nan]Fuzhou Univ, Coll Elect Engn & Automat, Fuzhou 350002, Peoples R China
  • [ 4 ] [Ma, Jing]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350002, Peoples R China

Reprint 's Address:

  • 马靖

    [Ma, Jing]Fuzhou Univ, Coll Phys & Informat Engn, Fuzhou 350002, Peoples R China

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Source :

JOURNAL OF OPTICS

ISSN: 2040-8978

Year: 2014

Issue: 10

Volume: 16

2 . 0 5 9

JCR@2014

2 . 0 0 0

JCR@2023

ESI Discipline: PHYSICS;

ESI HC Threshold:213

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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