Atomic　force　microscopy　(AFM)　investigating　the　sample　morphology　is　the　process　of　direct　interaction　between　tip　and　surface　features.　The　geometry　of　probe　tip　is　a　determining　factor　in　correcting　AFM　images　distorted　by　tip　size　itself.　A　quantitative　knowledge　of　the　current　tip　shape　is　needed　to　improve　the　reliability　of　AFM　images.　The　biaxially　oriented　polypropylene　(BOPP)　film　was　fabricated　and　used　as　tip　characterizer　to　estimate　the　morphology　of　AFM　Si　tip　based　on　the　blind　reconstruction　algorithm.　The　surface　of　the　BOPP　film　was　covered　by　nanometer-scale-sized　structures　which　ensure　that　the　tip　profile　can　be　determined　accurately.　Without　independent　knowledge　of　the　sample,　the　three-dimensional　(3D)　shape　of　Si　probe　tip　was　obtained　with　high　aspect　ratio.　BOPP　film　is　not　only　a　simple,　cheap　material　but　also　a　soft　one　which　can　also　avoid　tip　damage　in　scanning.　It　was　demonstrated　reliable　and　suitable　for　tip　characterization.