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author:

Chen, Jianli (Chen, Jianli.) [1] | Zhu, Wenxing (Zhu, Wenxing.) [2] (Scholars:朱文兴)

Indexed by:

EI Scopus SCIE

Abstract:

Placement is the process of determining the exact locations of circuit elements within a chip. It is a crucial step in very large scale integration (VLSI) physical design, because it affects routability, performance, and power consumption of a design. In this paper, we develop a new analytical placer to solve the VLSI standard cell placement problem. The placer consists of two phases, multilevel global placement (GP) and detailed cell placement (DP). In the stage of GP, during the clustering stage, we use a nonlinear programming technique and a best-choice clustering algorithm to take a global view of the whole netlist and placement information, and then use an iterative local refinement technique during the declustering stage to further distribute the cells and reduce the wirelength. In the stage of DP, we develop a fast legalization algorithm to make the solution by global placement legal and use a cell order polishing to improve the legal solution. The proposed algorithm is tested on the IBM standard cell benchmark circuits and Peko suites. Experimental results show that our placer obtains high-quality results in a reasonable running time.

Keyword:

Analytical approach detailed placement global placement standard cell placement very large scale integration (VLSI) physical design

Community:

  • [ 1 ] [Chen, Jianli]Fuzhou Univ, Ctr Discrete Math & Theoret Comp Sci, Fuzhou 350108, Peoples R China
  • [ 2 ] [Zhu, Wenxing]Fuzhou Univ, Ctr Discrete Math & Theoret Comp Sci, Fuzhou 350108, Peoples R China

Reprint 's Address:

  • 陈建利

    [Chen, Jianli]Fuzhou Univ, Ctr Discrete Math & Theoret Comp Sci, Fuzhou 350108, Peoples R China

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Source :

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS

ISSN: 0278-0070

Year: 2012

Issue: 8

Volume: 31

Page: 1208-1221

1 . 0 9 3

JCR@2012

2 . 7 0 0

JCR@2023

ESI Discipline: ENGINEERING;

JCR Journal Grade:2

CAS Journal Grade:3

Cited Count:

WoS CC Cited Count: 17

SCOPUS Cited Count: 22

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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