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author:

Tang Jing (Tang Jing.) [1] (Scholars:汤儆) | Zheng Jing-Jing (Zheng Jing-Jing.) [2] | Xu Wei (Xu Wei.) [3] | Tian Xiao-Chun (Tian Xiao-Chun.) [4] | Lin Jian-Hang (Lin Jian-Hang.) [5] (Scholars:林建航)

Indexed by:

Scopus SCIE PKU CSCD

Abstract:

We report a direct electrochemical deposition process to produce ZnO nanorods or a ZnO thin film on an indium tin oxide (ITO) substrate. The ZnO film was etched by an agarose stamp containing HCl as the etchant to form different patterns. The structure, morphology, and electrochemical properties of the ZnO thin films on the ITO substrate were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), and scanning electrochemical microscopy (SECM).

Keyword:

Agarose stamp Electrodeposition Scanning electrochemical microscopy ZnO nanorods array

Community:

  • [ 1 ] [Tang Jing]Fuzhou Univ, Coll Chem & Chem Engn, Minist Educ & Fujian Prov, Key Lab Anal & Detect Technol Food Safety, Fuzhou 350108, Peoples R China
  • [ 2 ] [Zheng Jing-Jing]Fuzhou Univ, Coll Chem & Chem Engn, Minist Educ & Fujian Prov, Key Lab Anal & Detect Technol Food Safety, Fuzhou 350108, Peoples R China
  • [ 3 ] [Xu Wei]Fuzhou Univ, Coll Chem & Chem Engn, Minist Educ & Fujian Prov, Key Lab Anal & Detect Technol Food Safety, Fuzhou 350108, Peoples R China
  • [ 4 ] [Tian Xiao-Chun]Fuzhou Univ, Coll Chem & Chem Engn, Minist Educ & Fujian Prov, Key Lab Anal & Detect Technol Food Safety, Fuzhou 350108, Peoples R China
  • [ 5 ] [Lin Jian-Hang]Fuzhou Univ, Instrumental Measurement & Anal Ctr, Fuzhou 350002, Peoples R China

Reprint 's Address:

  • 汤儆

    [Tang Jing]Fuzhou Univ, Coll Chem & Chem Engn, Minist Educ & Fujian Prov, Key Lab Anal & Detect Technol Food Safety, Fuzhou 350108, Peoples R China

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Source :

ACTA PHYSICO-CHIMICA SINICA

ISSN: 1000-6818

CN: 11-1892/O6

Year: 2011

Issue: 11

Volume: 27

Page: 2613-2617

0 . 7 8

JCR@2011

1 0 . 8 0 0

JCR@2023

ESI Discipline: CHEMISTRY;

JCR Journal Grade:4

CAS Journal Grade:4

Cited Count:

WoS CC Cited Count: 3

SCOPUS Cited Count:

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 0

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