SnS　and　Ag　films　were　deposited　on　glass　substrates　by　vacuum　thermal　evaporation　successively,　and　then　the　thin　films　were　annealed　at　260　degrees　C　in　N-2　for　different　times　(60min,　120min,　180min)　in　order　to　investigate　the　influence　of　annealing　time　on　the　silver-doped　SnS　(SnS:Ag)　films.　The　obtained　films　annealed　at　different　times　are　polycrystalline　SnS　with　orthogonal　structure,　and　the　crystallites　in　the　films　are　exclusively　oriented　along　the　{111}　direction.　With　the　increase　of　annealing　time,　the　uniformity　and　crystallization　of　the　films　are　improved,　the　carrier　concentration　and　mobility　of　the　films　first　rise　and　then　drop,　whereas　their　resistivity　and　direct　bandgap　energy　E-g　show　the　contrary　trend.