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author:

Wu, Liang (Wu, Liang.) [1] | Peng, Hui (Peng, Hui.) [2] | Guan, Xiangyu (Guan, Xiangyu.) [3] (Scholars:关向雨) | Peng, Yang (Peng, Yang.) [4]

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EI Scopus PKU CSCD

Abstract:

In order to achieve timely diagnosis of overheating faults of gas insulated bus bars (GIB), this paper established a GIB temperature rise thermal network model including contact structure based on thermoelectric analogy and heat transfer theory. The contact thermal resistances between the finger, the conductive rod and the substrate were calculated by the disk- contact single heat flow channel model (CMY model), and the nonlinear convective heat transfer resistance and the radiant heat transfer resistance of GIB were obtained by finite element numerical simulation. The physical tests of steady-state temperature rise of GIB under different test currents were carried out. The results show that: under different test currents, the calculation speed of thermal network method is about 34 times that of finite element method, the maximum temperature error between the calculated and measured values is 9.5%, and the minimum is 0.2%, which verifies the thermal network model of GIB. This model can be used to quickly estimate the finger and shell temperature of GIB, providing an effective analysis method for GIB thermal design and temperature rise monitoring. © 2020, Electrical Technology Press Co. Ltd. All right reserved.

Keyword:

Channel flow Finite element method Heat convection Heat resistance

Community:

  • [ 1 ] [Wu, Liang]School of Electrical and Automation, Wuhan University, Wuhan; 430072, China
  • [ 2 ] [Peng, Hui]School of Electrical and Automation, Wuhan University, Wuhan; 430072, China
  • [ 3 ] [Guan, Xiangyu]School of Electrical Engineering and Automation, Fuzhou University, Fuzhou; 350108, China
  • [ 4 ] [Peng, Yang]Central South Architectural Design Institute Co. Ltd, Wuhan; 430071, China

Reprint 's Address:

  • [wu, liang]school of electrical and automation, wuhan university, wuhan; 430072, china

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Source :

Transactions of China Electrotechnical Society

ISSN: 1000-6753

CN: 11-2188/TM

Year: 2020

Issue: 18

Volume: 35

Page: 3838-3847

Cited Count:

WoS CC Cited Count:

SCOPUS Cited Count: 5

ESI Highly Cited Papers on the List: 0 Unfold All

WanFang Cited Count:

Chinese Cited Count:

30 Days PV: 1

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